dr.ir. Michiel PertijsAssociate Professor
Expertise: Sensor interface circuits, smart sensors, ultrasonic imaging, acoustic sensors, energy efficiency, ultra-low power design, (self-)calibration techniques, capacitive sensors, precision analog circuits.Themes: Biomedical devices
|Group:||Electronic Instrumentation (EI)|
|Department of Microelectronics|
|Phone:||+31 15 27 86823|
Michiel Pertijs received the M.Sc. and Ph.D. degrees in electrical engineering (both cum laude) from Delft University Technology in 2000 and 2005, respectively. From 2000 to 2005, he was a researcher with the Electronic Instrumentation Laboratory of Delft University of Technology, working on high-accuracy CMOS smart temperature sensors. The results of his research have been applied in several commercial temperature sensors in collaboration with NXP. From 2005 to 2008, Dr. Pertijs was with National Semiconductor, where he designed precision operational amplifiers and instrumentation amplifiers. From 2008 to 2009, he was a Sr. Researcher at imec / Holst Centre, where he worked on ultra-low-power electronics for wireless autonomous transducer systems.
In 2009, he joined the Electronic Instrumentation Laboratory of Delft University of Technology, where he is now an Associate Professor. He heads a research group focusing on integrated circuits for medical ultrasound and energy-efficient smart sensors. Dr. Pertijs teaches Amplifiers and Instrumentation (EE1C31) in the EE BSc program and Measurement and Instrumentation (EE4C08) in the EE MSc Program. In 2014, he was elected Best Teacher of the EE program at Delft University of Technology.
Dr. Pertijs has authored or co-authored 2 books, 3 book chapters, 12 patents, and over 70 technical papers. He received the ISSCC 2005 Jack Kilby Award for Outstanding Student Paper and the IEEE Journal of Solid-State Circuits 2005 Best Paper Award. For his PhD research he was awarded the title 'Simon Stevin Gezel' by the Dutch Technology Foundation STW.
Dr. Pertijs serves as an Associate Editor of the IEEE Journal of Solid-State Circuits (JSSC), and as a member of the technical program committee of the International Solid-State Circuits Conference (ISSCC). He also served on the program committees of the European Solid-State Circuits Conference (ESSCIRC), the IEEE Sensors Conference and the IEEE PRIME Conference.
- Amplifiers and Instrumentation, EE1C31, with Dr. Jaap Hoekstra
- Measurement and Instrumentation, EE4C08, with Prof. Kofi Makinwa
- Smart Sensor Systems (ET4233) with Prof. Kofi Makinwa
- Mentor of the EE Honours Program Bachelor
- Mentor of the EEMCS Graduate School
Integrated Near Field sensOrs for high Resolution MicrowavE spectRoscopy
The goal of this project is the creation of a new class of sensors, enabling fast and accurate dielectric characterization of biological samples, with high-sensitivity and high-spatial resolution.
Last updated: 11 Aug 2017