prof.dr.ir. Willem van Driel

Parttime Professor
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics

Expertise: Solid state lighting reliability

Biography

Willem van Driel received the B.S. and M.S. degrees from the Eindhoven University of Technology, Eindhoven, The Netherlands, in 1992 and 1994, respectively, and in 2007 the Ph.D. degree from the Delft University of Technology, Delft, The Netherlands, all in mechanical engineering. He currently holds a position at Philips Lighting, Eindhoven, where he is responsible for solid state lighting reliability. He has authored over 300 scientific publications, including journal and conference papers, book or book chapters, patents, and invited keynote lectures. His current research interests include solid state lighting, microelectronics and microsystems technologies, virtual prototyping, virtual reliability qualification, and designing for reliability of microelectronics and microsystems.

Publications

  1. Exploring water and ion transport process at silicone/copper interfaces using in-situ electrochemical and Kelvin probe approaches
    B. Munirathinam; J.P.B. van Dam; A. Herrmann; W.D. van Driel; F. De Buyl; S.J.F. Erich; L.G.J. van der Ven; O.C.G. Adan; J.M.C. Mol;
    Journal of Materials Science & Technology,
    Volume 64, pp. 203 - 213, 2021. SI: Advanced Corrosion-Resistant Materials and Emerging Applications. DOI: https://doi.org/10.1016/j.jmst.2019.07.044
    document

  2. Correction: The inactivation mechanism of chemical disinfection against SARS-CoV-2: from MD and DFT perspectives
    Tan, Chunjian; Gao, Chenshan; Zhou, Quan; Van Driel, Willem; Ye, Huaiyu; Zhang, GuoQi;
    RSC Adv.,
    Volume 11, pp. 3509-3509, 2021. DOI: 10.1039/D0RA90127J
    document

  3. Facile Synthesis of Ag Nanowire/TiO2 and Ag Nanowire/TiO2/GO Nanocomposites for Photocatalytic Degradation of Rhodamine B
    Hajipour, Pejman; Bahrami, Abbas; Mehr, Maryam Yazdan; van Driel, Willem Dirk; Zhang, GuoQi;
    Materials,
    Volume 14, Issue 4, 2021. DOI: 10.3390/ma14040763
    document

  4. Prediction of software reliability
    W. van Driel; J.W. Bikker; M. Tijink;
    Microelectronics Reliability,
    Volume 119, pp. 114074, 2021. DOI: https://doi.org/10.1016/j.microrel.2021.114074
    document

  5. System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method
    Mesfin Seid Ibrahim; Jiajie Fan; Winco K.C. Yung; Zhou Jing; Xuejun Fan; Willem van Driel; Guoqi Zhang;
    Measurement,
    Volume 176, pp. 109191, 2021. DOI: https://doi.org/10.1016/j.measurement.2021.109191
    document

  6. The influence of phosphor particles on the water transport in optical silicones for LEDs
    A. Herrmann; S.J.F. Erich; L.G.J. v.d. Ven; H.P. Huinink; W.D. van Driel; M.van Soestbergen; A. Mavinkurve; F. Deuyl; J.M.C. Mol; O.C.G. Adan;
    Optical Materials: X,
    Volume 6, pp. 100047, 2020. DOI: https://doi.org/10.1016/j.omx.2020.100047

  7. Towards Multi-Functional SiO2@YAG:Ce Core–Shell Optical Nanoparticles for Solid State Lighting Applications
    Mahdi Kiani Khouzani; Abbas Bahrami; Maryam Yazdan Mehr; Willem Dirk van Driel; GuoQi Zhang;
    Nanomaterials,
    Volume 10, Issue 1, pp. 153, 2020. DOI: https://doi.org/10.3390/nano10010153

  8. Software Reliability for Agile Testing
    Willem Dirk van Driel; Jan Willem Bikker; Matthijs Tijink; Alessandro Di Bucchianico;
    Mathematics,
    Volume 8, Issue 5, pp. 791, 2020. DOI: https://doi.org/10.3390/math8050791

  9. Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light‐Emitting Diodes
    Mesfin Seid Ibrahim; Jiajie Fan; Winco K. C. Yung; Alexandru Prisacaru; Willem D. van Driel; Xuejun Fan; GuoQi Zhang;
    Laser and Photonics Reviews,
    Volume 14, Issue 12, Dec 2020. DOI: 10.1002/lpor.202000254
    document

  10. The inactivation mechanism of chemical disinfection against SARS-CoV-2: from MD and DFT perspectives
    Tan, Chunjian; Gao, Chenshan; Zhou, Quan; Van Driel, Willem; Ye, Huaiyu; Zhang, GuoQi;
    RSC Adv.,
    Volume 10, pp. 40480-40488, 2020. DOI: 10.1039/D0RA06730J
    document

  11. Sensor Systems Simulations: From Concept to Solution
    van Driel, W. D.; Pyper, O.; Schumann, C. (Ed.);
    Springer, , 2020. DOI: https://doi.org/10.1007/978-3-030-16577-2

  12. Ultraviolet Sensing in WBG: SiC
    Brahim el Mansouri; W.D. van Driel; GuoQi Zhang;
    Springer, , pp. 397-425, 2020.

  13. From Si Towards SiC Technology for Harsh Environment Sensing
    L. M. Middelburg; W. D. van Driel; GuoQi Zhang;
    Springer International Publishing, , 2020. DOI: 10.1007/978-3-030-16577-2_1
    document

  14. Health Monitoring for Lighting Applications
    W. D. van Driel; L. M. Middelburg; B. El Mansouri; B. J. C. Jacobs;
    Springer, , 2020.

  15. System Software Reliability
    Willem D. Van Driel; J.W. Bikker; M. Tijink;
    In 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    pp. 1-5, July 2020. DOI: 10.1109/EuroSimE48426.2020.9152686

  16. High-resolution MEMS inertial sensor combining large-displacement buckling behaviour with integrated capacitive readout
    Brahim El Mansouri; Luke M. Middelburg; Rene H. Poelma; GuoQi Zhang; Henk W. van Zeijl; Jia Wei; Hui Jiang; Johan G. Vogel; Willem D. van Driel;
    Microsystems & Nanoengineering,
    Volume 5, 2019.
    document

  17. Degradation of optical materials in solid-state lighting systems
    Yazdan Mehr, M.; Bahrami, A.; van Driel, W. D.; Fan, X. J.; Davis, J. L.; GuoQi Zhang;
    International Materials Reviews,
    2019. DOI: https://doi.org/10.1080/09506608.2019.1565716

  18. Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions
    Mehr, M. Y.; Van Driel, W.; GuoQi Zhang;
    In 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019,
    2019. DOI: https://doi.org/10.1109/EuroSimE.2019.8724524

  19. A review on discoloration and high accelerated testing of optical materials in LED based-products
    M. Yazdan Mehr; M.R. Toroghinejad; F. Karimzadeh; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 81, pp. 136-142, 2018.

  20. A stochastic process based reliability prediction method for LED driver
    Bo Sun; Xuejun Fan; Willem van Driel; Chengqiang Cui; GuoQi Zhang;
    Reliability Engineering and System Safety,
    Volume 178, pp. 140-146, 2018.

  21. Study on the Degradation of Optical Silicone Exposed to Harsh Environments
    Yazdan Mehr, M.; van Driel, W.; De Buyl, F.; GuoQi Zhang;
    Materials,
    2018. DOI: https://doi.org/10.3390/ma11081305

  22. Special issue: International conference on thermal, mechanical & multiphysics simulation and experiments in micro- and nano-electronics and systems [EuroSimE2017]
    van Driel, W. D.; Wymyslowski, A.;
    Microelectronics Reliability,
    2018. DOI: https://doi.org/10.1016/j.microrel.2018.06.012

  23. Quality and Reliability in Solid-State Lighting: Qua Vadis?
    Vos, T; den Breeijen, P.; van Driel, W. D.;
    Solid State Lighting Reliability Part 2: Components to Systems,
    2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_1

  24. Solid State Lighting Reliability Part 2: Components to Systems
    van Driel, W. (ed.); Fan, X. (ed.); Zhang, G. Q. (ed.) (Ed.);
    Springer International Publishing AG, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_1_16

  25. Lightning Effects on LED-Based Luminaires
    Agbemuko, A.; van Meurs, J.; van Driel, W. D.;
    Springer International Publishing, , pp. 573-583, 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_21

  26. Reliability Prediction of Integrated LED Lamps with Electrolytic Capacitor-Less LED Drivers
    Bo Sun; Fan, X.; van Driel, W. D. (ed.); GuoQi Zhang;
    Springer, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_16

  27. The Next Frontier: Reliability of Complex Systems
    Schenkelaars, D.; van Driel, W. D. (ed.); Duijve, R.;
    Springer International Publishing AG, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_22

  28. Statistical Analysis of Lumen Depreciation for LED Packages
    Schuld, M.; van Driel, W. D. (ed.); Jacobs, B.;
    Springer International Publishing, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_17

  29. LED-Based Luminaire Color Shift Acceleration and Prediction
    Lu, G.; van Driel, W. D. (ed.); Fan, X.; Fan, J.; GuoQi Zhang;
    Springer, , pp. 201-219, 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_9

  30. Reliability and Lifetime Assessment of Optical Materials in LED-Based Products
    Maryam Yazdan Mehr; Willem Dirk van Driel; GuoQi Zhang;
    In Solid State Lighting Reliability Part 2,
    Springer, 2018.

  31. Corrosion Sensitivity of LED Packages
    B.J.C. Jacobs; C. van der Marel; W.D. van Driel; S.J. Lu; X.P. Li;
    In Solid State Lighting Reliability Part 2: Components to Systems,
    Springer International Publishing AG, 2018.

  32. Designing a 100 [aF/nm] capacitive transducer
    L. M. Middelburg; B. El Mansouri; R. H. Poelma; H. W. van Zeijl; Jia Wei; GuoQi Zhang; W. D. van Driel;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2018.

  33. Lumen maintenance prediction for LEDs: New insights
    Jacobs, B.; van Driel, W. D.; Schuld, M.;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018. Piscataway, NJ: IEEE,
    pp. 1-4, 2018. DOI: https://doi.org/10.1109/EuroSimE.2018.8369895

  34. Color maintenance prediction for LED-based products
    W.D. van Driel; J.G.J. Beijer; J.W. Bikker; C.H.M. van Blokland; C. Ankomah B. Jacobs;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018,
    2018.

  35. Color shift acceleration on mid-power LED packages
    Guangjun Lu; Driel, W.D. van; Xuejun Fan; Jiajie Fan; Cheng Qian; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, Issue Supplement C, pp. 294 -- 298, 11 2017. DOI: 10.1016/j.microrel.2017.09.014
    Keywords: ... Color shift, Mid-power LED package, Temperature stress, Current stress, Humidity stress.

  36. Effects of Graphene Monolayer Coating on the Optical Performance of Remote Phosphors
    Maryam Yazdan Mehr; S. Vollebregt; W. D. van Driel; GuoQi Zhang;
    Journal of Electronic Materials,
    Volume 46, Issue 10, pp. 5866--5872, 2017. DOI: 10.1007/s11664-017-5592-8
    Keywords: ... graphene, Light-emitting diode, reliability, remote phosphor.

  37. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products
    Yazdan Mehr, M.; M.R. Toroghinejad; F. Karimzadeh; van Driel, W.D.; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, pp. 143--147, 2017. DOI: 10.1016/j.microrel.2017.08.014
    Keywords: ... BPA-PC, LED-based products, Optics, Oxidation, Yellowing.

  38. A Reliability Prediction for Integrated LED Lamp With Electrolytic Capacitor-Free Driver
    Bo Sun; X Fan; L Li; H Ye; W van Driel; GuoQi Zhang;
    IEEE Transactions on Components and Packaging and Manufacturing Technology,
    Volume 7, Issue 7, pp. 1081-1088, 2017.

  39. A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation
    Bo Sun; X Fan; H Ye; J Fan; C Qian; W van Driel; GuoQi Zhang;
    Reliability Engineering & System Safety,
    Volume 163, pp. 14-21, 2017.

  40. Prognostics \& health management for LED-based applications
    W.D. van Driel; B. Jacobs; D. Schenkelaars; M. Klompenhouwer; R. Poelma; B. El Mansouri; L.M. Middelburg;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  41. Smart Systems Integration in the era of Solid State Lighting
    GuoQi Zhang; H. van Zeijl; W.D. van Driel; R. Poelma; Z.K. Esfahani; M.R. Venkatesh; L. Middelburg; B. El Mansouri;
    In Smart System Integration conference (SSI),
    2017.

  42. LED degradation: From component to system
    B. Hamon; van Driel, Willem;
    Microelectronics Reliability,
    Volume 64, pp. 599--604, 9 2016. DOI: DOI: 10.1016/j.microrel.2016.07.014

  43. Lumen maintenance predictions for LED packages
    van Driel, Willem; M Schuld; B. Jacobs; F. Commissaris; van der Eyden, J; B. Hamon;
    Microelectronics Reliability,
    Volume 62, pp. 39--44, 3 2016. DOI: https://doi.org/10.1016/j.microrel.2016.03.018

  44. Creep fatigue models of solder joints: A critical review
    E.H. Wong; van Driel, Willem; A. Dasgupta; M. Pecht;
    Microelectronics Reliability,
    Volume 59, pp. 186--194, 1 2016.

  45. Colour shift and mechanism investigation on the PMMA diffuser used in LED-based luminaires
    G Lu; van Driel, WD; Xuejun Fan; Yazdan Mehr, M; Jiajie Fan; Cheng Qian; KMB Jansen; GQ Zhang;
    Optical Materials,
    Volume 54, pp. 282--287, 2016. harvest. DOI: 10.1016/j.optmat.2016.02.023
    Keywords: ... Colour shift, PMMA, Solid state lighting, LED-based luminaire, Infrared absorption spectroscopy.

  46. A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers
    Bo Sun; Xuejun Fan; van Driel, Willem; GuoQi Zhang;
    United States: IEEE, , pp. 1--5, 4 2016. DOI: 10.1109/EuroSimE.2016.7463387
    Keywords: ... Reliability, MOSFET, Electrolytic Capacitor-Free LED Driver.

  47. Lumen Decay Prediction in LED Lamps
    Bo Sun; Xuejun Fan; van Driel, Willem; Thomas Michel; Jiang Zhou; GuoQi Zhang;
    United States: IEEE, , pp. 1--5, 4 2016. DOI: 10.1109/EuroSimE.2016.7463391
    Keywords: ... Reliability, LED Lamp, Lumen Decay Prediction.

  48. Reinforced structure for a stack of layers in a semiconductor component
    HP Hochstenbach; van Driel, Willem;
    10 2016.

  49. Degradation of Microcellular PET Reflective Materials Used in LED-based Products
    Guangjun Lu; W.D. van Driel; Xuejun Fan; M. Yazdan Mehr; Jiajie Fan; K.M.B. Jansen; GuoQi Zhang;
    Optical Materials,
    Volume 49, pp. 79-84, 2015.

  50. Color shift investigations for LED secondary optical designs: Comparison between BPA-PC and PMMA
    Guangjun Lu; M. Yazdan Mehr; W.D. van Driel; Xuejun Fan; Jiajie Fan; K.M.B. Jansen; GuoQi Zhang;
    Optical Materials,
    Volume 45, pp. 37-41, 2015.

  51. Surface aspects of discolouration in Bisphenol A Polycarbonate (BPA-PC), used as lens in LED-based products
    Maryam Yazdan Mehr; W. D. van Driel; H. Udono; GuoQi Zhang;
    Optical Materials,
    Volume 37, pp. 155-159, 2014.

  52. Reliability and optical properties of LED lens plates under high temperature stress
    Maryam Yazdan Mehr; van Driel, WD; Koh, SW; GuoQi Zhang;
    Microelectronics Reliability,
    2014.

  53. Lifetime assessment of Bisphenol-A Polycarbonate (BPA-PC) plastic lens, used in LED-based products
    Maryam Yazdan Mehr; van Driel, WD; Jansen, KMB; Deeben, P; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 1, pp. 138-142, 2014.

  54. Accelerated life time testing and optical degradation of remote phosphor plates
    Maryam Yazdan Mehr; van Driel, WD; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 8, pp. 1544-1548, 2014.

  55. Multi-physics reliability simulation for solid state lighting drivers
    Tarashioon, S; van Driel, WD; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 6-7, pp. 1212-1222, 2014.

  56. Fracture toughness of Cu-EMC interfaces in pressurized steam
    Sadeghinia, M; Jansen, KMB amd Ernst, LJ; Pape, H; Maus, I; van Driel, WD; GuoQi Zhang;
    International Journal of Adhesion and Adhesives,
    Volume 49, pp. 73-79, 2014.

  57. Establishment of the Mesoscale Parameters for Separation: A Nonequilibrium Molecular Dynamics Model
    Cell K. Y. Wong; S. Y. Y. Leung; R. H. Poelma; K. M. B. Jansen; C. C. A. Yuan; W. D. van Driel; GuoQi Zhang;
    In Molecular Modeling and Multiscaling Issues for Electronic Material Applications,
    Springer, 2014.

  58. Reliability of LED-based Products is a Matter of Balancing Temperatures
    Maryam Yazdan Mehr; W.D. van Driel; GuoQi Zhang;
    In Therminic Conference,
    2014.

  59. Colour shift in remote phosphor based LED products
    Maryam Yazdan Mehr; Driel, WD van; GuoQi Zhang;
    In Proceedings - 64th Electronic Components and Technology Conference,
    pp. 1477-1481, 2014.

  60. Reliability and accelerated test methods for plastic materials in LED-based products
    Maryam Yazdan Mehr; van Driel, WD; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-5, 2014.

  61. Investigation of color shift of LEDs-based lighting products
    Koh, SW; Huaiyu Ye; Maryam Yazdan Mehr; Jia Wei; van Driel, WD; Zhao, LB; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-5, 2014.

  62. Software reliability and its interaction with hardware reliability
    van Driel, WD; Schuld, M; Wijgers, R; van Kooten, WEJ;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-8, 2014.

  63. Photodegradation of bisphenol A polycarbonate under blue light radiation and its effect on optical properties
    Maryam Yazdan Mehr; W. D. van Driel; K. M. B. Jansen; P. Deeben; M. Boutelje; GuoQi Zhang;
    Optical Materials,
    Volume 35, pp. 504-508, 2013.

  64. An approach to �Design for Reliability� in solid state lighting systems at high temperatures
    S. Tarashioon; A. Baiano; H. van Zeijl; C. Guo; S.W. Koh; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 52, Issue 5, pp. 783-793, May 2012. DOI 10.1016/j.microrel.2011.06.029.

  65. Establishment of the coarse grained parameters for epoxy-copper interfacial separation
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    Journal of Applied Physics,
    Volume 111, Issue 9, pp. 094906/1-094906, May 2012. DOI 10.1063/1.4712060.

  66. Diagnosing lumen depreciation in LED lighting systems: An estimation approach
    J. Dong; A. Pandharipande; W. van Driel; GuoQi Zhang;
    IEEE Transactions on Signal Processing,
    Volume 60, Issue 7, pp. 3796-3808, Jul. 2012. DOI 10.1109/TSP.2012.2192114.

  67. Solid State Lighting Reliability: Components to Systems
    W.D. van Driel; X.J. Fan;
    Springer, , Aug. 2012. DOI 10.1007/978-1-4614-3067-4.

  68. Semi empirical low cycle fatigue crack growth analysis of nanostructure chip-to-package copper interconnect using molecular simulation
    S. Koh; A. Saxena; W.D. van Driel; GuoQi Zhang; R. Tummala;
    In Molecular Modeling and Multiscaling for Electronic Material Applications,
    Springer, 2012. DOI 10.1007/978-1-4614-1728-6_5.

  69. MEMS accelerometers and their bio-applications
    M. Trifunovic; A.M. Vadiraj; W.D. van Driel;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191749.

  70. Modeling lead free solder reliability in SSL applications towards virtual design
    R. Kregting; M. Erinc; J. Kloosterman; W.D. van Driel;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, pp. 1-6, Apr. 2012. DOI 10.1109/ESimE.2012.6191755.

  71. Thermal and moisture degradation in SSL system
    S. Koh; W.D. van Driel; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, pp. 1-6, Apr. 2012. DOI 10.1109/ESimE.2012.6191806.

  72. System approach for reliability of low-power power electronics: How to break down into their constructed parts
    S. Tarashioon; W.D. van Driel; GuoQi Zhang;
    In 7th International Conference on Integrated Power Electronics Systems (CIPS 2012),
    Nuremberg, Germany, pp. 1-5, Mar. 2012.

  73. Establishment of the mesoscale parameters for epoxy-copper interfacial separation
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191737.

  74. Co-design of wafer level thin film package assembly
    J.J.M. Zaal; F. Santagata; W.D. van Driel; GuoQi Zhang; J.F. Creemer; P.M. Sarro;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-6, Apr. 2011. ISBN 978-1-4577-0106-1.
    document

  75. Degradation of epoxy lens materials in LED systems
    S. Koh; W.D. van Driel; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-5, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765850.

  76. Molecular Dynamics study of the traction-displacement relations of epoxy-copper interfaces
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-5, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765785.

  77. Algorithmic foundation of the Clockwork Orange Robot Soccer Team
    P.P. Jonker; B. van Driel; V.G. Kutchoukov; B. Terwijn;
    M. Erdmann; D. Hsu; M. Overmars; {van der Stappen}, A.F. (Ed.);
    Springer Verlag, , pp. 17-26, 2005.

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Last updated: 28 Apr 2021