MSc Xiao Hu
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics
Expertise: Multi-scale simulation, interface failure mechanism, machine learningThemes: XG - Next Generation Sensing and Communication
Xiao Hu received her M.Sc degree in Materials and Photoelectrons and her Bachelor degree in Physics from East China Normal University (China), in 2020 and 2017 respectively.In Oct. 2020, She joined the Electronic Components, Technology and Materials (ECTM) group as a PhD student and worked with Prof. Kouchi Zhang. Her main research topic is investigating the failure mechanism of backside metal system by multi-scale and multi-physics simulation.
Fundamentals of backside metals system for 5G RF power modules
Last updated: 8 Feb 2021