K. Kouwenhoven

1. Resolving Power of Visible-To-Near-Infrared Hybrid β-Ta/Nb-Ti-N Kinetic Inductance Detectors
   Kevin Kouwenhoven; Daniel Fan; Enrico Biancalani; Steven A.H. de Rooij; Tawab Karim; Carlas S. Smith; Vignesh Murugesan; David J. Thoen; Jochem J.A. Baselmans; Pieter J. de Visser;
   Physical Review Applied,
   Volume 19, Issue 3, Mar. 2023. DOI: 10.1103/PhysRevApplied.19.034007

2. Hydrogenated amorphous silicon carbide: A low-loss deposited dielectric for microwave to submillimeter-wave superconducting circuits
   B. T. Buijtendorp; S. Vollebregt; K. Karatsu; D. J. Thoen; V. Murugesan; K. Kouwenhoven; S. Hähnle; J. J. A. Baselmans; A. Endo;
   Physical Review Applied,
   Volume 18, pp. 064003, 2022. DOI: 10.1103/PhysRevApplied.18.064003

3. Hydrogenated Amorphous Silicon Carbide: A Low-loss Deposited Dielectric for Microwave to Submillimeter Wave Superconducting Circuits
   Buijtendorp, B. T.; Vollebregt, S. ; Karatsu, K.; Thoen, D. J.; Murugesan, V.; Kouwenhoven, K.; Hähnle, S.; Baselmans, J. J. A.; Endo, A.;
   Physical Review Applied,
   Volume 18, Issue 6, pp. 064003, 2022. DOI: https://doi.org/10.1103/PhysRevApplied.18.064003

4. Model and Measurements of an Optical Stack for Broadband Visible to Near-Infrared Absorption in TiN MKIDs
   Kouwenhoven, K.; Elwakil, I.; Wingerden; J. van, Murugesan; V., Thoen, D. J.; Baselmans, J. J. A.; Visser, P. J. d.;
   Journal of Low Temperature Physics,
   pp. 0123456789, 2022. DOI: https://doi.org/10.1007/s10909-022-02774-0

5. Low-loss a-SiC:H for superconducting microstrip lines for (sub-)millimeter astronomy
   Bruno T. Buijtendorp; Akira Endo; Kenichi Karatsu; David Thoen; Vignesh Murugesan; Kevin Kouwenhoven; Sebastian Hähnle; Jochem J. A. Baselmans; Sten Vollebregt;
   In Proc. SPIE PC12190, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XI,
   pp. PC121900W, 2022. DOI: 10.1117/12.2630107

6. Superconducting Microstrip Losses at Microwave and Submillimeter Wavelengths
   Hähnle, S.; Kouwenhoven, K.; Buijtendorp, B.; Endo, A.; Karatsu, K.; Thoen, D.J.; Murugesan, V.; Baselmans, J.J.A.;
   Physical Review Applied,
   Volume 16, Issue 1, pp. 014019, Jul. 2021. DOI: 10.1103/PhysRevApplied.16.014019
   document

7. Hydrogenated Amorphous Silicon Carbide: A Low-loss Deposited Dielectric for Microwave to Submillimeter Wave Superconducting Circuits
   B. T. Buijtendorp; S. Vollebregt; K. Karatsu; D. J. Thoen; V. Murugesan; K. Kouwenhoven; S. Hähnle; J. J. A. Baselmans, A. Endo;
   arXiv,
   2021.
   document

8. Trade-offs in low-noise design (Chapter 27)
   M.H.L. Kouwenhoven; A. van Staveren; W.A. Serdijn; C.J.M. Verhoeven;
   In Trade-Offs in Analog Circuit Design,
   Kluwer Academic Publishers, Nov. 2002.

9. Trade-offs in frequency compensation (Chapter 10)
   A. van Staveren; M.H.L. Kouwenhoven; W.A. Serdijn; C.J.M. Verhoeven;
   In Trade-Offs in Analog Circuit Design,
   Kluwer Academic Publishers, Nov. 2002.

10. Trade-offs in bandgap reference design (Chapter 6)
    A. van Staveren; M.H.L. Kouwenhoven; W.A. Serdijn; C.J.M. Verhoeven;
    In Trade-Offs in Analog Circuit Design,
    Kluwer Academic Publishers, Nov. 2002.

11. Effect of smooth nonlinear distortion on OFDM symbol error rate
    C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn;
    IEEE Transactions on Communications,
    Volume 49, Issue 9, pp. 1510-1514, Sept. 2001.
    document

12. Low power design in Europe: a novel knowledge sharing action
    R. van Leuken; R. Nouta; A. de Graaf; M. Kouwenhoven; C. Verhoeven;
    In Design, Automation and Test in Europe Conference 2000--user forum,
    Paris (F), March 2000.

13. The influence of non-linear distortion on OFDM bit error rate
    C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn;
    In Proc. International Conference on Communications,
    New Orleans, LA, USA, IEEE, pp. 1125-1129, June 18-22 2000. ISBN: 0-7803-6283-7.
    document

14. A dynamic-translinear fully-integrated highly-directional hearing-aid adapter
    C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn: Effect of smooth non-linear distortion on OFDM BER;
    In Proc. International Symposium on Circuits and Systems (ISCAS),
    Geneva, Switzerland, IEEE, pp. 469-472, May 28-31 2000. ISBN: 0-7803-6286-1.

15. High efficiency HF power amplifiers with integrated transformer feedback
    Hartingsveldt K. van; M.H.L. Kouwenhoven; C.J.M. Verhoeven; N.J. Burghartz;
    In Proc. SAFE-ProRISC-SeSens,
    pp. 285-292, 2000. ISBN 90-73461-24-3.

16. Dynamic translinear circuits
    W.A. Serdijn; J. Mulder; P.J. Poort; M.H.L. Kouwenhoven; A. van Staveren; A.H.M. van Roermund;
    In Analog Circuit Design,
    Kluwer Academic Publishers, 1999. ISBN: 0-7923-8400-8.
    document

17. Non-linear distortion and OFDM bit-error rate
    C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn;
    In Proc. ProRISC Workshop on Circuits, Systems and Signal processing,
    Mierlo, the Netherlands, Nov. 25-26 1999.

18. Analysis of noise in higher-order translinear filters
    M.H.L. Kouwenhoven; J. Mulder; W.A. Serdijn; A.H.M. van Roermund;
    In Proc. International Symposium on Circuits and Systems,
    Orlando, FL, USA, IEEE, May 30 - June 2 1999.
    document

19. A low-voltage translinear second-order quadrature oscillator
    W.A. Serdijn; J. Mulder; M.H.L. Kouwenhoven; A.H.M. van Roermund;
    In Proc. International Symposium on Circuits and Systems,
    Orlando, FL, USA, IEEE, May 30 - June 2 1999.
    document

20. Analysis of noise in static and dynamic translinear circuits
    M.H.L. Kouwenhoven; J. Mulder; W.A. Serdijn; A.C. van der Woerd; A.H.M. van Roermund;
    In Proc. ProRISC Workshop on Circuits, Systems and Signal Processing,
    Mierlo, the Netherlands, Nov. 26-27 1998.

21. A low-voltage translinear second-order quadrature oscillator
    W.A. Serdijn; J. Mulder; M.H.L. Kouwenhoven; A.H.M. van Roermund;
    In Proc. ProRISC Workshop on Circuits, Systems and Signal Processing,
    Mierlo, the Netherlands, Nov. 26-27 1998.

22. Analysis of noise in translinear filters
    J. Mulder; M.H.L. Kouwenhoven; W.A. Serdijn; A.C. van der Woerd; A.H.M. van Roermund;
    In Proc. International Symposium on Circuits and Systems (ISCAS),
    Monterey, CA, USA, IEEE, May 31 1998-Jun 1998.
    document

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