ir. F Mubarak

Electronic Circuits and Architectures (ELCA), Department of Microelectronics


  1. Noise Behavior and Implementation of Interferometer-Based Broadband VNA
    F. A. Mubarak; R. Romano; L. Galatro; V. Mascolo; G. Rietveld; M. Spirito;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 67, Issue 1, pp. 249-260, Jan 2019. DOI: 10.1109/TMTT.2018.2874667
    Keywords: ... coplanar waveguides;network analysers;radiowave interferometers;complex noise behavior;vector network analyzers;VNA measurement noise performance;broadband measurement;coplanar waveguide;active RF interferometer module approach;interferometer-based broadband VNA noise model;scanning microwave microscope;renormalized impedance level;phase stability;frequency 1.0 GHz to 18.0 GHz;resistance 0.5 ohm;resistance 5 kohm;Noise measurement;Impedance measurement;Frequency measurement;Impedance;Broadband communication;Radio frequency;Sensitivity;Extreme impedance measurement;impedance mismatch;microwave interferometry;nanoelectronics;nanostructures;noise;vector network analyzer (VNA).

  2. The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances
    R. Romano; F. Mubarak; M. Spirito; L. Galatro;
    In 2019 93rd ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-6, June 2019. DOI: 10.1109/ARFTG.2019.8739232
    Keywords: ... calibration;electric impedance measurement;electric resistance measurement;mixers (circuits);network analysers;radiowave interferometers;radiowave interferometry;resistors;HΓ-VNA;interferometric approach;IQ mixer-based RF-interferometer module;custom on-wafer calibration kit;fused silica substrate;short-open-load calibration technique;DUT;impedance resistor measurement;resistance 50 ohm;resistance 3.5 kohm to 7 kohm;SiO2;Calibration;Impedance;Impedance measurement;Sensitivity;Reflection coefficient;Standards;Mixers;vector network analyzer;extreme impedance;interferometer;IQ mixer;high gamma.

  3. On the definition of reference planes in probe-level calibrations
    L. Galatro; F. Mubarak; M. Spirito;
    In 2016 87th ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-4, May 2016.

  4. Improved RSOL planar calibration via EM modelling and reduced spread resistive layers
    M. Spirito; L. Galatro; G. Lorito; T. Zoumpoulidis; F. Mubarak;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-5, Dec 2015.

  5. Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements
    F. Mubarak; R. Romano; M. Spirito;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-3, Dec 2015.

  6. A method for de-embedding cable flexure errors in S-parameter measurements
    F. Mubarak; G. Rietveld; M. Spirito;
    In 83rd ARFTG Microwave Measurement Conference,
    pp. 1-5, June 2014.

  7. Characterizing cable flexure effects in S-parameter measurements
    F. Mubarak; G. Rietveld; D. Hoogenboom; M. Spirito;
    In 82nd ARFTG Microwave Measurement Conference,
    pp. 1-7, Nov 2013.

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Last updated: 26 Dec 2018

Faisal Mubarak

  • Left in 2017