prof.dr.ir. J.H. Huijsing

Guest
Electronic Instrumentation (EI), Department of Microelectronics

Expertise: Precision operational and Instrumentation amplifiers, voltage references, smart sensors

Themes: Safety and security

Biography

Johan H. Huijsing was born on May 21, 1938. He received the M.Sc. degree in EE from the Delft University of Technology, the Netherlands in 1969, and the Ph.D. degree from this University in 1981. He has been an assistant and associate professor in Electronic Instrumentation at the Faculty of EE of the Delft University of Technology since 1969. He became a full professor in the chair of Electronic Instrumentation since 1990, and professor-emeritus since 2003. From 1982 through 1983 he was a senior scientist at Philips Research Labs. in Sunnyvale, California, USA. From 1983 until 2005 he was a consultant for Philips Semiconductors, Sunnyvale, California, USA, and since 1998 also a consultant for Maxim, Sunnyvale, California, USA. The research work of Johan Huijsing is focused on operational amplifiers, analog-to-digital converters and integrated smart sensors. He has supervised 30 PhD students. He is author or co-author of more than 300 scientific papers, 40 US patents and 15 books. In 1992 he initiated the international Workshop on Advances in Analog Circuit Design. He co-organized it yearly until 2003. He has been a member of the programme committee of the European Solid-State Circuits Conference from 1992 untill 2002. He was chairman of the Dutch STW Platform on Sensor Technology and of the biannual national Workshop on Sensor Technology from 1991 until 2002. He is Fellow of IEEE, and was awarded the title of Simon Stevin Meester by the Dutch Technology Foundation.

Publications

  1. A Chopper-Stabilized Amplifier with -107dB IMD and 28dB Suppression of Chopper-Induced IMD
    T. Rooijers; S. Karmakar; Y. Kusuda; J. H. Huijsing; K. A. A. Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    February 2021. DOI: 10.1109/ISSCC42613.2021.9365790

  2. An Auto-Zero Stabilized Voltage Buffer with a Quiet Chopping Scheme and Constant Input Current
    T. Rooijers; J.H. Huijsing; K.A.A. Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    2 2019. DOI: 10.1109/ISSCC.2019.8662437

  3. An Auto-Zero Stabilized Voltage Buffer with a Trimmed Input Current of 0.2pA
    T. Rooijers; J.H. Huijsing; K.A.A. Makinwa;
    In Proc. European Solid-State Circuits Conference (ESSCIRC),
    9 2019. DOI: 10.1109/ESSCIRC.2019.8902895

  4. A ±12A High-Side Current Sensor with 25V Input CM Range and 0.35% Gain Error from -40ºC to 85ºC
    L. Xu; J.H. Huijsing; K.A.A. Makinwa;
    IEEE Solid-State Circuits Letters,
    Volume 1, pp. 94-97, 4 2018. DOI: 10.1109/LSSC.2018.2855407
    Abstract: ... This letter presents the most accurate shunt-based high-side current sensor ever reported. It achieves a 25 V input common-mode range from a single 1.8-V supply by using a beyond-the-rails ADC. A hybrid analog/digital temperature compensation scheme is proposed to simplify the circuit implementation while maintaining the state-of-the-art accuracy. Over a ±12-A current range, the sensor exhibits 0.35% gain error from -40 °C to 85 °C with 3× better power efficiency.

  5. A ±4-A High-Side Current Sensor With 0.9% Gain Error From −40 °C to 85 °C Using an Analog Temperature Compensation Technique
    L. Xu; J. H. Huijsing; K. A. A. Makinwa;
    IEEE Journal of Solid-State Circuits,
    Volume 53, Issue 12, pp. 3368-3376, 12 2018. DOI: 10.1109/JSSC.2018.2875106
    Abstract: ... This paper presents a fully integrated shunt-based current sensor that supports a 25-V input common-mode range while operating from a single 1.5-V supply. It uses a high-voltage beyond-the-rails ADC to directly digitize the voltage across an on-chip shunt resistor. To compensate for the shunt's large temperature coefficient of resistance (~0.335%/°C), the ADC employs a proportional-to-absolute-temperature voltage reference. This analog compensation scheme obviates the need for the explicit temperature sensor and calibration logic required by digital compensation schemes. The sensor achieves 1.5-μVrms noise over a 2-ms conversion time while drawing only 10.9 μA from a 1.5-V supply. Over a ±4-A range, and after a one-point trim, the sensor exhibits a 0.9% (maximum) gain error from -40 °C to 85 °C and a 0.05% gain error at room temperature.

  6. A ±4A high-side current sensor with 25V input CM range and 0.9% gain error from −40° C to 85° C using an analog temperature compensation technique
    L. Xu; J.H. Huijsing; K.A.A. Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    pp. 324-326, 2 2018. DOI: 10.1109/ISSCC.2018.8310315

  7. A quiet digitally assisted auto-zero-stabilized voltage buffer with 0.6 pA input current and offset
    T. Rooijers; J.H. Huijsing; K.A.A. Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    pp. 50-52, 2 2018. DOI: 10.1109/ISSCC.2018.8310178

  8. Fully Capacitive Coupled Input Choppers
    J. H. Huijsing; Q. Fan; K. A. A. Makinwa;
    Patent, US US10033369B2, July 2018. Assignee: Maxim Integrated Products Inc.

  9. A 10kHz-BW 93.7dB-SNR Chopped ΔΣ ADC with 30V Input CM Range and 115dB CMRR at 10kHz
    L. Xu; J.H. Huijsing; K.A.A. Makinwa;
    In 2017 IEEE Asian Solid-State Circuits Conference,
    2017.

  10. A 12μW NPN-based Temperature Sensor with a 18.4pJ·K2 FOM in 0.18μM BCD CMOS
    L. Xu; J.H. Huijsing; K.A.A. Makinwa;
    In Proc. Int. Workshop on Advances in Sensors and Interfaces (IWASI),
    June 2017. DOI: 10.1109/iwasi.2017.7974246

  11. Fast-Settling Capacitive-Coupled Amplifiers
    J.H. Huijsing; Q. Fan; K.A.A. Makinwa; D. Fu; J. Wu; L. Zhou;
    Patent, 9,294,049, March 22 2016.

  12. A 110dB SNR ADC with ±30V input common-mode range and 8¿V Offset for current sensing applications
    L. Xu; B. Gönen; Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    In M Romdhane; LC Fujino; J Anderson (Ed.), Proceedings of the 2015 IEEE International Solid-State Circuits Conference,
    IEEE, pp. 89-91, 2015. Harvest Session 5.2.

  13. Measurement and analysis of current noise in chopper amplifiers
    J. Xu; Q. Fan; J.H. Huijsing; C. van Hoof; R.F. Yazicioglu; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 48, Issue 7, pp. 1575-1584, 2013. Harvest.

  14. A Low-Power CMOS Smart Temperature Sensor with a Batch-Calibrated Inaccuracy of ±0.25°C (±3σ) from -70°C to 130°C
    A. Aita; M. Pertijs; K. Makinwa; J. Huijsing; G. Meijer;
    IEEE Sensors Journal,
    Volume 13, Issue 5, pp. 1840‒1848, May 2013. DOI: 10.1109/JSEN.2013.2244033
    Abstract: ... In this paper, a low-power CMOS smart temperature sensor is presented. The temperature information extracted using substrate PNP transistors is digitized with a resolution of 0.03°C using a precision switched-capacitor (SC) incremental ΔΣ A/D converter. After batch calibration, an inaccuracy of ±0.25°C (±3) from -70°C to 130°C is obtained. This represents a two-fold improvement compared to the state-of-the-art. After individual calibration at room temperature, an inaccuracy better than ±0.1°C over the military temperature range is obtained, which is in-line with the state-of-the-art. This performance is achieved at a power consumption of 65 μW during a measurement time of 100 ms, by optimizing the power/inaccuracy tradeoffs, and by employing a clock frequency proportional to absolute temperature. The latter ensures accurate settling of the SC input stage at low temperatures, and reduces the effects of leakage currents at high temperatures.

  15. Precision Instrumentation Amplifiers and Read-Out Integrated Circuits
    R. Wu; J.H. Huijsing; K.A.A. Makinwa;
    Springer New York, in Analog Circuits and Sinal Processing, 2013. Published as e-book in 2012; printed version 2013.

  16. A multi-path chopper-stabilized capacitively coupled operational amplifier with 20V-input-common-mode range and 3μV offset
    Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    In A Chandrakasan (Ed.), Digest of Technical Papers - 2013 IEEE International Solid-State Circuits Conference (ISSCC 2013),
    IEEE, pp. 176-177, 2013. Harvest Session 10.

  17. A 20-b ± 40-mV range read-out IC with 50-nV offset and 0.04% gain error for bridge transducers
    R. Wu; Y. Chae; J.H. Huijsing; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 47, Issue 9, pp. 2152-2163, September 2012. Harvest.

  18. A 21 nV/√ Hz chopper-stabilized multi-path current-feedback instrumentation amplifier with 2 μ v offset
    Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 47, Issue 2, pp. 464-475, February 2012. Harvest Article number: 6112184.

  19. Measurement and analysis of input current noise in chopper amplifiers
    J. Xu; Q. Fan; J.H. Huijsing; C. van Hoof; R.F. Yazicioglu; K.A.A. Makinwa;
    In Y. Deval; J-B Begueret; D Belot (Ed.), Proceedings 2012 38th European Solid-State Circuit Conference,
    IEEE, pp. 81-84, 2012.

  20. A capacitively coupled chopper instrumentation amplifier with a ±30V common-mode range, 160dB CMRR and 5μV offset
    Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    In L Fujino (Ed.), Digest of Technical Papers - 2012 IEEE International Solid-state Circuits Conference,
    IEEE, pp. 374-375, 2012. Harvest Article number: 6177045.

  21. A capacitively-coupled chopper operational amplifier with 3μV Offset and outside-the-rail capability
    Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    In Y. Deval; J-B Begueret; D Belot (Ed.), Proceedings 2012 38th European Solid-State Circuit Conference,
    IEEE, pp. 73-76, 2012.

  22. A current-feedback instrumentation amplifier with a gain error reduction loop and 0.06% untrimmed gain error
    R. Wu; J.H. Huijsing; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 46, Issue 12, pp. 2794-2806, December 2011. NEO.

  23. A 1.8 µW 60 nV/√Hz Capacitively-Coupled Chopper Instrumentation Amplifier in 65 nm CMOS for Wireless Sensor Nodes
    Qinwen Fan; Fabio Sebastiano; Johan H. Huijsing; Kofi A.A. Makinwa;
    {IEEE} J. Solid-State Circuits,
    Volume 46, Issue 7, pp. 1534 - 1543, July 2011. DOI: 10.1109/JSSC.2011.2143610
    Keywords: ... CMOS integrated circuits;choppers (circuits);instrumentation amplifiers;wireless sensor networks;CMOS technology;CMRR;DC servo loop;PSRR;biopotential sensing;capacitively-coupled chopper instrumentation amplifier;chopping ripple;current 1.8 muA;electrode offset suppression;low-power precision instrumentation amplifier;noise efficiency factor;positive feedback loop;power 1.8 muW;rail-to-rail input common-mode range;ripple reduction loop;size 65 nm;voltage 1 V;wireless sensor nodes;Capacitors;Choppers;Impedance;Noise;Sensors;Topology;Wireless sensor networks;Bio-signal sensing;chopping;high power efficiency;low offset;low power;precision amplifier;wireless sensor nodes.

    Abstract: ... This paper presents a low-power precision instrumentation amplifier intended for use in wireless sensor nodes. It employs a capacitively-coupled chopper topology to achieve a rail-to-rail input common-mode range as well as high power efficiency. A positive feedback loop is employed to boost its input impedance, while a ripple reduction loop suppresses the chopping ripple. To facilitate bio-potential sensing, an optional DC servo loop may be employed to suppress electrode offset. The IA achieves 1 µV offset, 0.16% gain inaccuracy, 134 dB CMRR, 120 dB PSRR and a noise efficiency factor of 3.3. The instrumentation amplifier was implemented in a 65 nm CMOS technology. It occupies only 0.1 mm² chip area (0.2 mm² with the DC servo loop) and consumes 1.8 µA current (2.1 µA with the DC servo loop) from a 1 V supply.

  24. A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33μV/°C Offset Drift
    M. Bolatkale; M. A. P. Pertijs; W. J. Kindt; J. H. Huijsing; K. A. A. Makinwa;
    IEEE Journal of Solid-State Circuits,
    Volume 46, Issue 9, pp. 2099‒2107, September 2011. DOI: 10.1109/JSSC.2011.2139530
    Abstract: ... A MOS-input operational amplifier has a reconfigurable input stage that enables trimming of both offset and offset drift based only on single-temperature measurements. The input stage consists of a MOS differential pair, whose offset drift is predicted from offset voltage measurements made at well-defined bias currents. A theoretical motivation for this approach is presented and validated experimentally by characterizing the offset of pairs of discrete MOS transistors as a function of bias current and temperature. An opamp using the proposed single-temperature trimming technique has been designed and fabricated in a 0.5 μm BiCMOS process. After single-temperature trimming, it achieves a maximum offset of ± 30 μV and an offset drift of 0.33 μV/°C (3σ) over the temperature range of -40°C to +125°C.

  25. Operational Amplifiers: Theory and Design
    J.H. Huijsing;
    Kluwer Academic Publishers, Volume Kluwer International Seri , 2011.

  26. A 21-bit Read-Out IC Employing Dynamic Element Matching with 0.037% Gain Error
    R. Wu; J.H. Huijsing; K.A.A. Makinwa;
    In K-N Kim; S-I Liu (Ed.), 2011 IEEE Asian Solid-State Circuits Conference,
    IEEE, pp. 241-244, 2011.

  27. A current-feedback instrumentation amplifier with a gain error reduction loop and 0.06% untrimmed gain error
    R. Wu; J.H. Huijsing; K.A.A. Makinwa;
    In A Chandrakasan; {Gass et al}, W (Ed.), Digest of Technical Papers - 2011 IEEE International Solid-State Circuits Conference,
    IEEE, pp. 244-246, February 2011.

  28. A 21b ±40mV range read-out IC for bridge transducers
    R. Wu; J.H. Huijsing; K.A.A. Makinwa;
    In A Chandrakasan; {Gass et al}, W (Ed.), Digest of Technical Papers - 2011 IEEE International Solid-State Circuits Conference,
    IEEE, pp. 110-111, February 2011. NEO.

  29. Input characteristics of a chopped multi-path current feedback instrumentation amplifier
    Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    In {De Venuto}, D; L Benini (Ed.), 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI),
    IEEE, pp. 61-66, 2011.

  30. Single slope analog-to-digital converter
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    2011.

  31. Low-cost calibration techniques for smart temperature sensors
    M. A. P. Pertijs; A. L. Aita; K. A. A. Makinwa; J. H. Huijsing;
    IEEE Sensors Journal,
    Volume 10, Issue 6, pp. 1098‒1105, June 2010. DOI: 10.1109/jsen.2010.2040730
    Abstract: ... Smart temperature sensors generally need to be trimmed to obtain measurement errors below ±2°C. The associated temperature calibration procedure is time consuming and therefore costly. This paper presents two, much faster, voltage calibration techniques. Both make use of the fact that a voltage proportional to absolute temperature (PTAT) can be accurately generated on chip. By measuring this voltage, the sensor's actual temperature can be determined, whereupon the sensor can be trimmed to correct for its dominant source of error: spread in the on-chip voltage reference. The first calibration technique consists of measuring the (small) PTAT voltage directly, while the second, more robust alternative does so indirectly, by using an external reference voltage and the on-chip ADC. Experimental results from a prototype fabricated in 0.7 μm CMOS technology show that after calibration and trimming, these two techniques result in measurement errors (±3σ) of ±0.15°C and ±0.25°C, respectively, in a range from -55°C to 125°C.

  32. 12-bit accurate voltage-sensing ADC with curvature-corrected dynamic reference
    N. Saputra; M. A. P. Pertijs; K. A. A. Makinwa; J. H. Huijsing;
    Electronics Letters,
    Volume 46, Issue 6, pp. 397‒398, March 2010. DOI: 10.1049/el.2010.3337
    Abstract: ... A sigma-delta analogue-to-digital converter (ADC) with a dynamic voltage reference is presented that achieves 12-bit absolute accuracy over the extended industrial temperature range (-40 to 105°C). Temperature-dependent gain errors due to the reference's curvature are digitally corrected by adjusting the gain of the ADC's decimation filter. The required correction factor is obtained by first using the reference to make a temperature measurement, and then translating the result into a correction factor by means of a lookup table and a linear interpolator. Thus, a dynamic voltage reference is realised with a measured temperature drift of less than 1.7 ppm/°C. The ADC was fabricated in 0.7 μm CMOS technology and consumes 85 μA from a 2.5-5.5 V supply.

  33. A 21nV/¿Hz chopper-stabilized multipath current-feedback instrumentation amplifier with 2µV offset
    Q. Fan; J.H. Huijsing; K.A.A. Makinwa;
    In H Hidaka; B. Nauta (Ed.), Digest of Technical Papers - 2010 IEEE International Solid-State Circuits Conference,
    IEEE, pp. 80-81, 2010.

  34. A 1.8µW 1-µV-offset capacitively-coupled chopper instrumentation amplifier in 65nm CMOS
    Qinwen Fan; Fabio Sebastiano; Johan H. Huijsing; Kofi A.A. Makinwa;
    In Proc. European Solid-State Circuits Conference,
    Sevilla, Spain, pp. 170 - 173, September14--16 2010. DOI: 10.1109/ESSCIRC.2010.5619902
    Keywords: ... CMOS integrated circuits;instrumentation amplifiers;CMOS;input impedance;noise efficiency factor;positive feedback loop;precision capacitively-coupled chopper instrumentation amplifier;rail-to-rail DC common-mode input range;ripple reduction loop;size 65 nm;Accuracy;Choppers;Impedance;Instruments;Noise;Resistors;Topology.

    Abstract: ... This paper describes a precision capacitively-coupled chopper instrumentation amplifier (CCIA). It achieves 1µV offset, 134dB CMRR, 120dB PSRR, 0.16% gain accuracy and a noise efficiency factor (NEF) of 3.1, which is more than 3x better than state-of-the-art. It has a rail-to-rail DC common-mode (CM) input range. Furthermore, a positive feedback loop (PFL) is used to boost the input impedance, and a ripple reduction loop (RRL) is used to reduce the ripple associated with chopping. The CCIA occupies only 0.1mm² in a 65nm CMOS technology. It can operate from a 1V supply, from which it draws only 1.8µA.

  35. A 2.1 µW Area-Efficient Capacitively-Coupled Chopper Instrumentation Amplifier for ECG Applications in 65 nm CMOS
    Qinwen Fan; Fabio Sebastiano; Johan H. Huijsing; Kofi A.A. Makinwa;
    In Proc. Asian Solid-State Circuits Conference,
    Beijing, China, pp. 1 - 4, November8--10 2010. DOI: 10.1109/ASSCC.2010.5716624
    Keywords: ... CMOS integrated circuits;amplifiers;biomedical electrodes;choppers (circuits);electrocardiography;CMOS technology;DC servo loop;ECG application;area efficient chopper instrumentation amplifier;capacitive feedback network;capacitively coupled chopper instrumentation amplifier;electrocardiography;electrode-tissue interface;power 2.1 muW;switched capacitor integrator;Choppers;DSL;Earth Observing System;Electrocardiography;Impedance;Instruments;Noise.

    Abstract: ... This paper describes a capacitively-coupled chopper instrumentation amplifier for use in electrocardiography (ECG). The amplifier's gain is accurately defined by a capacitive feedback network, while a DC servo loop rejects the DC offset generated by the electrode-tissue interface. The high-pass corner frequency established by the servo loop is realized by an area-efficient switched-capacitor integrator. Additional feedback loops are employed to boost the amplifier's input-impedance to 80 MΩ and to suppress the chopper ripple. Implemented in a 65 nm CMOS technology, the amplifier draws 2.1 µA from a 1 V supply and occupies 0.2 mm².

  36. Auto-gain correction and common-mode voltage cancellation in a precision amplifier.
    R.E. Boucher; J.H. Huijsing;
    2010.

  37. Digital temperature sensors and calibration thereof
    M. Pertijs; J. Huijsing;
    Patent, United States 7,674,035, March 2010.

  38. Digitale temperatursensoren und kalibrierung dafür
    M. A. P. Pertijs; J. H. Huijsing;
    Patent, German 602,005,020,159, May 2010.

  39. Bias-steuerung
    M. A. P. Pertijs; J. H. Huijsing;
    Patent, German 602,005,018,235, January 2010.

  40. A chopper current-feedback instrumentation amplifier with a 1mHz 1/f noise corner and an AC-coupled ripple reduction loop
    R. Wu; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 44, pp. 3232-3243, 2009.

  41. Dynamic offset compensated CMOS amplifiers
    J.F. Witte; K.A.A. Makinwa; J.H. Huijsing;
    Springer, , 2009.

  42. A low noise current feedback instrumentation amplifier for high precision thermistor bridge
    Wu Rong; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    Sense of Contact 2009, , pp. 01-04, 2009.

  43. A chopper and auto-zero offset-stabilized CMOS instrumentation amplifier
    J.F. Witte; J.H. Huijsing; K.A.A. Makinwa;
    In K Yano (Ed.), IEEE Digest of VLSI Circuits 2009,
    IEEE, pp. 210-211, 2009.

  44. A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ±0.25°C (3σ) from -70°C to 130°C
    A. L. Aita; M. Pertijs; K. Makinwa; J. H. Huijsing;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    IEEE, pp. 342‒343, February 2009. DOI: 10.1109/ISSCC.2009.4977448
    Abstract: ... A major contributor to the total cost of precision CMOS temperature sensors is the cost of trimming and calibration. Significant cost savings can be obtained by batch calibration, but this is usually at the expense of an equally significant loss of accuracy. This paper presents a CMOS temperature sensor with a batch-calibrated inaccuracy of ±0.25°C (3σ) from -70°C to 130°C, which represents a 2x improvement over the state of the art. Individual trimming reduces the sensor's inaccuracy to ±0.1°C (3σ) over the military range: -55°C to 125°C. The sensor draws 25μA from a 2.5V to 5.5V supply, which is significantly less than commercial products with comparable accuracy.

  45. Chopper stabilized amplifiers combining low chopper noise and linear frequency characteristics
    J.H. Huijsing; K.A.A. Makinwa; J.F. Witte;
    2009.

  46. A current-feedback instrumentation amplifier with 5 microvolts offset for bidirectional high-side current-sensing
    J.F. Witte; J.H. Huijsing; K.A.A. Makinwa;
    IEEE Journal of Solid State Circuits,
    Volume 43, Issue 12, pp. 2769-2775, 2008.

  47. High resolution IF-to-baseband ADC for AM/FM car radios
    P.G.R. Silva; J.H. Huijsing;
    Springer Science + Business Media B.V., , 2008.

  48. Dynamic Offset Cancellation in Operational Amplifiers and Instrumentation Amplifiers
    J.H. Huijsing;
    M. Steyaert; A.H.M. van Roermund; H Casier (Ed.);
    Springer, , pp. 99-123, 2008.

  49. Instrumentation amplifier developments
    J.H. Huijsing;
    {Andrea Baschirotto,Piero Malcovati} (Ed.);
    University of pavia, , pp. 105-136, 2008.

  50. The design of a chopped current-feedback instrumentation amplifier
    R. Wu; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), ISCAS 2008, IEEE International Symposium,
    ISCAS, pp. 2466-2469, 2008.

  51. A current-feedback instrumentation amplifier with 5 microvolts offset for bidirectional high-side current-sensing
    J.F. Witte; J.H. Huijsing; K.A.A. Makinwa;
    In s.n. (Ed.), Proceedings of ISSCC 2008,
    ISSCC, pp. 74-76, 2008.

  52. Silicon sensors, an introduction
    J.H. Huijsing;
    In {G.C.M. Meijer} (Ed.), Smart sensor systems,
    Wiley, pp. 1-55-77, 2008.

  53. Smart sensor systems: why where how?
    J.H. Huijsing;
    In G.C.M. Meijer (Ed.), Smart sensor systems,
    Wiley, pp. 1-1-21, 2008.

  54. A low power chopper current-feedback instrumentation amplifier with noise PSD of 17nV/Hz
    R. Wu; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), ProRISC, pp. 279-282, 2008.

  55. Voltage calibration of smart temperature sensors
    M. A. P. Pertijs; A. L. Aita; K. A. A. Makinwa; J. H. Huijsing;
    In Proc. IEEE Sensors Conference,
    IEEE, pp. 756‒759, October 2008. DOI: 10.1109/icsens.2008.4716551

  56. Sigma delta ADC with a dynamic reference for accurate temperature and voltage sensing
    N. Saputra; M. A. P. Pertijs; K. A. A. Makinwa; J. H. Huijsing;
    In Proc. IEEE International Symposium on Circuits and Systems (ISCAS),
    IEEE, pp. 1208‒1211, May 2008. DOI: 10.1109/iscas.2008.4541641

  57. A BiCMOS Operational Amplifier Achieving 0.33μV/°C Offset Drift using Room-Temperature Trimming
    M. Bolatkale; M. A. P. Pertijs; W. J. Kindt; J. H. Huijsing; K. A. A. Makinwa;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    IEEE, pp. 76‒77, February 2008. DOI: 10.1109/isscc.2008.4523064

  58. Bias circuits
    M. Pertijs; J. Huijsing;
    Patent, United States 7,446,598, November 2008.

  59. Bitstream controlled reference signal generation for a sigma-delta modulator
    M. A. P. Pertijs; K. A. A. Makinwa; J. H. Huijsing;
    Patent, United States 7,391,351, June 2008.

  60. Multiple-ramp column-parallel ADC architectures for CMOS image sensors
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 42, Issue 12, pp. 2968-2977, 2007.

  61. A CMOS chopper offset-stabilized opamp
    J.F. Witte; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 42, Issue 7, pp. 1529-1535, 2007.

  62. An IF-to-baseband sigma delta modulator for AM/FM/IBOC radio receivers with a 118 dB dynamic range
    P.G.R. Silva; K.A.A. Makinwa; J.H. Huijsing; L.J. Breems; R. Roovers;
    IEEE Journal of Solid State Circuits,
    Volume 42, Issue 5, pp. 1076-1089, 2007.

  63. High-Precision Read-Out Circuit for Thermistor Temperature Sensor
    R. Wu; K.A.A. Makinwa; J.H. Huijsing; S. Nihtianov;
    , pp. -, 2007.

  64. Standard CMOS Hall-Sensor with Integrated Interface Electronics for a 3D Compass Sensor
    J. van der MeerC; K.A.A. Makinwa; J.H. Huijsing; F.R. Riedijk;
    In s.n. (Ed.), Standard CMOS Hall-Sensor with Integrated Interface Electronics for a 3D Compass Sensor,
    IEEE, pp. 1-4, 2007.

  65. A CMOS image sensor with a column-level multiple-ramp single-slope ADC
    M.F. Snoeij; P. Donegan; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International,
    IEEE, pp. 1-4, 2007.

  66. A three stage amplifier with quenched multipath frequency compensation for all capacitive loads
    J. Hu; J.H. Huijsing; K.A.A. Makinwa;
    In s.n. (Ed.), Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on,
    IEEE, pp. 225-228, 2007.

  67. Power and Area Efficient Column-Parallel ADC Architectures for CMOS Image Sensors
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing; K.A.A. Makinwa;
    In s.n. (Ed.), Proceedings IEEE Sensors 2007,
    IEEE, pp. 523-526, 2007.

  68. Smart sensor design: the art of compensation and cancellation
    K. A. A. Makinwa; M. A. P. Pertijs; J. C. van der Meer; J. H. Huijsing;
    In Proc. European Solid-State Circuits Conference (ESSCIRC),
    IEEE, pp. 76‒82, September 2007. DOI: 10.1109/esscirc.2007.4430251

  69. Accurate voltage to current converters for rail-sensing current-faadback instrumentation amplifiers
    J.H. Huijsing; B. Shahi;
    2007.

  70. Accurate voltage to current converters for rail-sensing current feedback instrumentation amplifiers
    J.H. Huijsing; Shahi Behzad;
    2007.

  71. Frequency stabilization of chopper-stabilized amplifiers
    J.H. Huijsing; M.J. Fonderie; B. Shahi;
    2007.

  72. A CMOS Imager With Column-Level ADC Using Dynamic column Fixed-pattern Noise Reduction (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 41, Issue 12, pp. 3007-3015, 2006.

  73. A Solid-state 2-D Wind Sensor (U-SP-2-I-ICT)
    K.A.A. Makinwa; J.H. Huijsing; A. Hagedoorn;
    Lecture Notes in Computer Science,
    Issue 4017, pp. 1-8, 2006.

  74. Precision temperature sensors in CMOS technology
    M. A. P. Pertijs; J. H. Huijsing;
    Springer Science \& Business Media, , 2006.
    Abstract: ... The low cost and direct digital output of CMOS smart temperature sensors are important advantages compared to conventional temperature sensors. This book addresses the main problem that nevertheless prevents widespread application of CMOS smart temperature sensors: their relatively poor absolute accuracy. Several new techniques are introduced to improve this accuracy. The effectiveness of these techniques is demonstrated using three prototypes. The final prototype achieves an inaccuracy of ±0.1 °C over the military temperature range, which is a significant improvement in the state of the art. Since smart temperature sensors have been the subject of academic and industrial research for more than two decades, an overview of existing knowledge and techniques is also provided throughout the book.

    document

  75. An 118dB CT IF-to-Baseband/spl sigma//spl Delta/Modulator for AM/FM/IBOC Radio Receivers (U-SP-2-I-ICT)
    P.G.R. Silva; K.A.A. Makinwa; J.H. Huijsing; L.J. Breems; R. Roovers;
    s.n. (Ed.);
    IEEE, , pp. 1-10, 2006.

  76. A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    s.l., , pp. 498-499, 2006.

  77. A CMOS Imager with column-level ADC using dynamic column FPN reduction (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    s.l., , pp. 2014-2023, 2006.

  78. Column-parallel single-slope ADCS for CMOS image sensors (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    Eurosensors, , pp. 1-4, 2006.

  79. Sigma Delta ADC with accurate dynamic reference for temperature sensing and voltage monitoring (U-SP-2-I-ICT)
    N. Saputra; J.H. Huijsing; K.A.A. Makinwa;
    In s.n. (Ed.), Sigma Delta ADC with accurate dynamic reference for temperature sensing and voltage monitoring,
    ProRISC, pp. 1-5, 2006.

  80. A CMOS chopper offset-stabilized opamp (U-SP-2-I-ICT)
    J.F. Witte; K.A.A. Makinwa; J.H. Huijsing;
    In Ch Enz; M Declercq; Y Leblebici (Ed.), Proceedings of the 32nd European Solid-State Circuits Conference, 2006. ESSCIRC 2006,
    IEEE, pp. 360-363, 2006.

  81. Noise analysis of continuous-time /spl sigma// spl delta/modulators with switched-capacitor feedback DAC (U-SP-2-I-ICT)
    P.G.R. Silva; K.A.A. Makinwa; J.H. Huijsing; L.J. Breems;
    In s.n. (Ed.), Proceedings of the 2006 ISCAS Conference,
    IEEE, pp. 1-4, 2006.

  82. An 8-bit, 4-Gsample/s Track-and-Hold in a 67GHz fT SiGe BiCMOS technology (U-SP-2-I-ICT)
    D. Smola; J.H. Huijsing; K.A.A. Makinwa; H. van der Ploeg; M. Vertregt; L.J. Breems;
    In Ch Enz; M Declercq; Y Leblebici (Ed.), Proceedings of the 32nd European Solid-State Circuits Conference, 2006. ESSCIRC 2006,
    IEEE, pp. 1-4, 2006.

  83. A 110dB dynamic range continuous-time IF-to-baseband sigma-delta modulator for AM/FM/IBOC receivers (U-SP-2-I-ICT)
    P.G.R. Silva; L.J. Breems; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of the 2006 ISCAS Conference,
    IEEE, pp. 1-4, 2006.

  84. "Column-parallel Single Slope ADCs for CMOS Image Sensors" (U-SP-2-I-ICT)
    M.F. Snoeij; A.J.P. Theuwissen; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), Eurosensors XX 2006,
    Eurosensors, pp. 284-287, 2006.

  85. Sigma Delta ADC with Accurate Dynamic Reference for Temperature Sensing and Voltage Monitoring
    N. Saputra; M. A. P. Pertijs; K. A. A. Makinwa; J. H. Huijsing;
    In Annual Workshop on Circuits, Systems and Signal Processing (ProRISC),
    The Netherlands, pp. 80‒84, November 2006.

  86. Chopper chopper-stabilized instrumentation and operational amplifiers (U_SP_2_I_IC_T)
    J.H. Huijsing; B. Shahi;
    2006.

  87. Chopper chopper-stabilized instrumentation and operational amplifiers
    J.H. Huijsing; B. Shahi;
    2006.

  88. Device for determining the direction and speed of an air flow
    J.H. Huijsing; Jan Verhoeven;
    2006.

  89. A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.1°C from -55°C to 125°C
    M. A. P. Pertijs; K. A. A. Makinwa; J. H. Huijsing;
    IEEE Journal of Solid-State Circuits,
    Volume 40, Issue 12, pp. 2805‒2815, December 2005. (JSSC Best Paper Award). DOI: 10.1109/JSSC.2005.858476
    Abstract: ... A smart temperature sensor in 0.7 μm CMOS is accurate to within ±0.1°C (3σ) over the full military temperature range of -55°C to 125°C. The sensor uses substrate PNP transistors to measure temperature. Errors resulting from nonidealities in the readout circuitry are reduced to the 0.01°C level. This is achieved by using dynamic element matching, a chopped current-gain independent PTAT bias circuit, and a low-offset second-order sigma-delta ADC that combines chopping and correlated double sampling. Spread of the base-emitter voltage characteristics of the substrate PNP transistors is compensated by trimming, based on a calibration at one temperature. A high trimming resolution is obtained by using a sigma-delta current DAC to fine-tune the bias current of the bipolar transistors.

  90. A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.5°C from -50°C to 120°C
    M. A. P. Pertijs; A. Niederkorn; X. Ma; B. McKillop; A. Bakker; J. H. Huijsing;
    IEEE Journal of Solid-State Circuits,
    Volume 40, Issue 2, pp. 454‒461, February 2005. DOI: 10.1109/JSSC.2004.841013
    Abstract: ... A low-cost temperature sensor with on-chip sigma-delta ADC and digital bus interface was realized in a 0.5 μm CMOS process. Substrate PNP transistors are used for temperature sensing and for generating the ADC's reference voltage. To obtain a high initial accuracy in the readout circuitry, chopper amplifiers and dynamic element matching are used. High linearity is obtained by using second-order curvature correction. With these measures, the sensor's temperature error is dominated by spread on the base-emitter voltage of the PNP transistors. This is trimmed after packaging by comparing the sensor's output with the die temperature measured using an extra on-chip calibration transistor. Compared to traditional calibration techniques, this procedure is much faster and therefore reduces production costs. The sensor is accurate to within ±0.5°C (3σ) from -50°C to 120°C.

  91. Low-Cost Epoxy Packaging of CMOS Hall-effect Compasses (U-SP-2-I-ICT)
    J. van der Meer; F.R. Riedijk; E.J. van Kampen; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    IEEE, , pp. 65-68, 2005.

  92. Low-cost epoxy packaging of CMOS Hall-effect compasses (U-SP-2-I-ICT)
    J. van der Meer; K.A.A. Makinwa; J.H. Huijsing; F.R. Riedijk; E.J. van Kampen;
    s.n. (Ed.);
    IEEE, , pp. 65-68, 2005.

  93. A 2nd order thermal sigma-delta modulator for flow sensing (U-SP-2-I-ICT)
    K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    IEEE, , pp. 549-552, 2005.

  94. A fully-integrated CMOS Hall sensor with a 4.5uT, 3s offset spread for compass applications (U-SP-2-I-ICT)
    J. van der Meer; K.A.A. Makinwa; J.H. Huijsing;
    s.n. (Ed.);
    s.l., , pp. 246-247-195,6, 2005.

  95. A 1.8 V 3.2 /spl mu/W comparator for use in a CMOS imager column-level single-slope ADC
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In s.n. (Ed.), ISCAS 2005, IEEE International Symposium on Circuits and Systems, 2005,
    IEEE, pp. 6162-6165, 2005. Editor onbekend, WPM.

  96. A fully integrated CMOS hall sensor with a 3.65/spl mu/T 3/spl sigma/ offset for compass applications
    J. van der MeerC; F.R. Riedijk; E.A. van Kampen; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), ISSCC 2005 conference digest,
    IEEE, pp. 246-247, 2005. geen editors-sb.

  97. Ultra high-speed sampling track-and-hold amplifier in SiGe Bi-CMOS technology
    D. Smola; H. van der Ploeg; M. Vertregt; L. Breems; J.H. Huijsing; K.A.A. Makinwa;
    In s.n. (Ed.), Proceedings of the STW annual workshop on semiconductor advances for future electronics and sensors (SAFE 2005),
    Technologiestichting STW, pp. 295-298, 2005. Editor onbekend, WPM/STW.

  98. The effect of switched biasing on 1/f noise in CMOS imager front-ends
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of the 2005 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors,
    s.n., pp. 68-71, 2005. Editor onbekend, WPM.

  99. A low-power column-parallel 12-bit ADC for CMOS imagers
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of the 2005 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors,
    s.n., pp. 169-172, 2005. Editor onbekend, WPM.

  100. A high resolution IF-to-baseband continious-time ¿¿ modulator for AM/FM/IBOC radio receiver
    P.G.R. Silva; L.J. Breems; K.A.A. Makinwa; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of ProRISC 2005, 16th Annual Workshop on Circuits, Systems and Signal Processing,
    Dutch Technology Foundation, pp. 289-294, 2005. editors onbekend, sb.

  101. Precision interface electronics for a CMOS smart temperature sensor
    M. A. P. Pertijs; J. H. Huijsing;
    In Proc. IEEE Sensors Conference,
    IEEE, pp. 4‒pp, October 2005. (invited paper). DOI: 10.1109/ICSENS.2005.1597856
    Abstract: ... This paper describes the interface electronics of a CMOS smart temperature sensor that is accurate to plusmn0.1degC over the full military temperature range. The sensor is fabricated in a standard CMOS process. Substrate bipolar transistors are used as temperature-sensitive devices. Precision interface electronics are used to make the most of their temperature characteristics. While the sensor is trimmed at one temperature, its accuracy over the full temperature range depends on the initial accuracy of the electronics. Dynamic offset cancellation and dynamic element matching are used to eliminate offset and gain errors. These techniques are combined with a sigma-delta ADC to obtain a readily usable digital temperature reading

  102. A CMOS temperature sensor with a 3σ inaccuracy of ±0.1°C from -55°C to 125°C
    M. Pertijs; K. Makinwa; J. Huijsing;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    IEEE, pp. 238‒596, February 2005. ({ISSCC} 2005 {Jack} {Kilby} Award for Outstanding Student Paper). DOI: 10.1109/ISSCC.2005.1493957
    Abstract: ... A smart temperature sensor is accurate to within ±0.1°C (3σ) over the full military temperature range of -55°C to 125°C. This 5x improvement is achieved using DEM, a current-gain independent PTAT bias circuit, and a low-offset ΔΣ ADC combining chopping and CDS. The sensor is fabricated in 0.7μm 2M1P CMOS with 4.5mm² area and draws 75μA.

  103. Device for determining the direction and speed of an air flow
    H.J.B. Verhoeven; J.H. Huijsing; A. Hagedoorn; B.W. van Oudheusden;
    2005. Mierij Meteo b.v.; ES2225885T; Mierij Meteo b.v..

  104. Circuit, including feedback, for reducing DC-offset and noise produced by an amplifier
    A. Bakker; J.H. Huijsing;
    2005. Koninklijke Philips Electronics N.V.; US6911864; Koninklijke Philips Electronics N.V..

  105. Systematic design exploration of Delta-Sigma ADCs
    O. Bajdechi; G.G.E. Gielen; J.H. Huijsing;
    IEEE Transactions on Circuits and Systems Part 1: Fundamental Theory and Applications,
    Volume 51, Issue 1, pp. 86-95, 2004.

  106. Precision temperature measurement using CMOS substrate PNP transistors
    M. A. P. Pertijs; G. C. M. Meijer; J. H. Huijsing;
    IEEE Sensors Journal,
    Volume 4, Issue 3, pp. 294‒300, June 2004. DOI: 10.1109/jsen.2004.826742
    Abstract: ... This paper analyzes the nonidealities of temperature sensors based on substrate pnp transistors and shows how their influence can be minimized. It focuses on temperature measurement using the difference between the base-emitter voltages of a transistor operated at two current densities. This difference is proportional to absolute temperature (PTAT). The effects of series resistance, current-gain variation, high-level injection, and the Early effect on the accuracy of this PTAT voltage are discussed. The results of measurements made on substrate pnp transistors in a standard 0.5μm CMOS process are presented to illustrate the effects of these nonidealities. It is shown that the modeling of the PTAT voltage can be improved by taking the temperature dependency of the effective emission coefficient into account using the reverse Early effect. With this refinement, the temperature can be extracted from the measurement data with an absolute accuracy of ±0.1°C in the range of -50 to 130°C.

  107. High speed, wide band, digital RF receiver front-end system
    D. Smola; M. Vertregt; H. van der Ploeg; L.J. Breems; J.H. Huijsing; K.A.A. Makinwa; P.G.R. Silva; J.M.V. Misker; Q Sandifort; A Emmerik; {van Donselaar}, B;
    STW, Volume Progress report , 2004.

  108. High speed, wide band, digital RF receiver front-end system
    D. Smola; M. Vertregt; H. van der Ploeg; L.J. Breems; J.H. Huijsing; K.A.A. Makinwa; P.G.R. Silva; J.M.V. Misker; Q Sandifort; A Emmerik; {van Donselaar}, B;
    STW, Volume Progress report , 2004.

  109. The effect of non-idealities in CMOS chopper amplifiers
    J.F. Witte; K.A.A. Makinwa; J.H. Huijsing;
    In SAFE c23891d54bc448e7886feafd1793b771 ProRISC 2004; Proceedings of the program for research on integrated systems and circuits,
    STW Technology Foundation, pp. 616-619, 2004. ed. is niet bekend.

  110. CMOS quad spinning-current hall-sensor system for compass application
    J. van der MeerC; F.R. Riedijk; P.C. de Jong; E.A. van Kampen; M.J. Meekel; J.H. Huijsing;
    In s.n. (Ed.), Proceedings of IEEE Sensors, 2004,
    IEEE, pp. 1434-1437, 2004. niet eerder opgevoerd - sb.

  111. Low-cost calibration techniques for smart temperature sensors
    M. A. P. Pertijs; J. H. Huijsing;
    In Annual Sensor Technology Workshop Sense of Contact,
    The Netherlands, pp. 17, March 2004.

  112. Bitstream trimming of a smart temperature sensor
    M. A. P. Pertijs; J. H. Huijsing;
    In Proc. IEEE Sensors Conference,
    IEEE, pp. 904‒907, October 2004. DOI: 10.1109/ICSENS.2004.1426317
    Abstract: ... The paper presents a high-resolution trimming technique for use in precision smart temperature sensors. A digital sigma-delta modulator is used to trim the bias current of a bipolar transistor to compensate for process spread. In contrast with conventional trimming techniques, only a small chip area is required. The implementation of this technique in a temperature sensor with a sigma-delta ADC is discussed. On a prototype realized in 0.7μm CMOS, an 8-bit trimming resolution was measured, corresponding to 0.02°C on a range of 4.5°C.

  113. A second-order sigma-delta ADC using MOS capacitors for smart sensor applications
    M. A. P. Pertijs; A. Bakker; J. H. Huijsing;
    In Proc. IEEE Sensors Conference,
    IEEE, pp. 421‒424, October 2004. DOI: 10.1109/ICSENS.2004.1426189
    Abstract: ... This paper presents a second-order sigma-delta ADC designed for use in a smart temperature sensor. It is operated in a 'one-shot' mode, i.e. the converter is powered up, produces a single conversion result, and powers down again. This paper discusses the implications of this mode of operation for the design of the modulator and the decimation filter. A sinc² decimation filter is used, which is shown to provide a higher resolution then a more complex sinc³ with the same conversion time. Through continuous-time integration of the input and reference voltages, the use of a linear sampling capacitor at the input is avoided. The modulator was implemented in a 0.5μm digital CMOS process using MOS capacitors. An effective resolution of 15.5 bits was measured with a conversion time of 25 ms.

  114. A sigma-delta modulator with bitstream-controlled dynamic element matching
    M. A. P. Pertijs; J. H. Huijsing;
    In Proc. European Solid-State Circuits Conference (ESSCIRC),
    IEEE, pp. 187‒190, September 2004. DOI: 10.1109/ESSCIR.2004.1356649
    Abstract: ... When dynamic element matching (DEM) techniques are applied to generate a precision reference for a (single-bit) sigma-delta modulator, intermodulation occurs between the DEM residuals and the bitstream, which increases the in-band quantization noise. This can be prevented by deriving the sequence of DEM steps from the bitstream. This technique has been implemented in a second-order sigma-delta modulator with a dynamic bandgap voltage reference, which was realized in a 0.7μm CMOS process. Measurements show complete elimination of intermodulation products in the signal band, corresponding to an 8 dB reduction in quantization noise compared to conventional cyclic DEM.

  115. Chopper chopper-stabilized operational amplifiers and methods
    J.H. Huijsing; M.J. Fonderie;
    2004.

  116. Compensation of packaging asymmetry in a 2-D wind sensor
    SP. Matova; K.A.A. Makinwa; J.H. Huijsing;
    IEEE Sensors Journal,
    Volume 3, Issue 6, pp. 761-765, 2003.

  117. Low-voltage power-efficient operational amplifier design techniques - an overview
    K-J. de Langen; J.H. Huijsing;
    s.n. (Ed.);
    IEEE, , pp. 1-8, 2003.

  118. Robust DC model for the offset trimming of an integrated thermal wind sensor
    SP. Matova; P Matov; J.H. Huijsing;
    In s.n. (Ed.), EUROSENSORS 17th European conference on solid-state transducers,
    University of Minho, pp. 363-366, 2003.

  119. A high-accuracy CMOS smart temperature sensor with fast calibration procedure
    M. A. P. Pertijs; A. Niederkorn; X. Ma; B. McKillop; A. Bakker; J. Huijsing;
    In Annual Sensor Technology Workshop Sense of Contact,
    The Netherlands, pp. 37, March 2003.

  120. A CMOS temperature sensor with a 3σ inaccuracy of ±0.5°C from -50°C to 120°C
    M. Pertijs; A. Niederkorn; X. Ma; B. McKillop; A. Bakker; J. Huijsing;
    In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
    IEEE, pp. 200‒201, February 2003. DOI: 10.1109/ISSCC.2003.1234266
    Abstract: ... A temperature sensor in 0.5μm CMOS achieves an accuracy of ±0.5°C (3σ) from -50°C to 120°C. It combines chopping, dynamic element matching and curvature correction with calibration at room temperature. Calibration time has been reduced to less than 1s by using an on-chip transistor to measure the die temperature.

  121. Amplifier with stabilization means
    J.H. Huijsing; K.J. de Langen;
    2003.

  122. GM-controlled current-isolated indirect-feedback instrumentation amplifier
    J.H. Huijsing; B. Shahi;
    2003.

  123. Constant power operation of a two-dimensional flow sensor
    K.A.A. Makinwa; J.H. Huijsing;
    IEEE Transactions on Instrumentation and Measurement,
    Volume 51, Issue 4, pp. 840-844, 2002.

  124. A 1.8-V (delta epsilon) modulator interface for an electric microphone with on-chip reference
    O. Bajdechi; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 37, Issue 3, pp. 279-285, 2002.

  125. A smart wind sensor using thermal sigma-delta modulation techniques
    K.A.A. Makinwa; J.H. Huijsing;
    Sensors and Actuators A: Physical: an international journal devoted to research and development of physical and chemical transducers,
    Volume A 97-98, pp. 15-20, 2002.

  126. A smart CMOS wind sensor
    K.A.A. Makinwa; J.H. Huijsing;
    IEEE International Solid State Circuits Conference. Digest of Technical Papers,
    Volume 45, pp. 432-544, 2002.

  127. Modeling and compensation of packaging asymmetry in a 2-D wind sensor
    SP. Matova; K.A.A. Makinwa; J.H. Huijsing;
    s.n., , pp. 70-73, 2002.

  128. Modeling and simulation of thermal sigma-delta modulators
    K.A.A. Makinwa; V. Székely; J.H. Huijsing;
    In The frontier of instrumention and measurement,
    IEEE Instrumentation and Measurement Society, pp. 261-264, 2002.

  129. Optimal design of delta-sigma ADCs by design space exploration
    O. Bajdechi; G. Gielen; J.H. Huijsing;
    In SIGDA publications on CD-Rom: DAC2002,
    ACM Press, pp. 1-6, 2002. CD-Rom.

  130. An oscillator based on a thermal delay line
    J.F. Witte; K.A.A. Makinwa; J.H. Huijsing;
    In Proceedings of SeSens 2002,
    STW Stichting voor de Technische Wetenschappen, pp. 696-699, 2002.

  131. Read-out circuits for fixed-pattern noise reduction in a CMOS active pixel sensor
    M.F. Snoeij; A.J.P. Theuwissen; J.H. Huijsing;
    In Proceedings of SeSens 2002,
    STW Stichting voor de Technische Wetenschappen, pp. 676-676, 2002.

  132. P2-14: Compensation of packaging asymmetry in a 2-D wind sensor
    SP. Matova; K.A.A. Makinwa; J.H. Huijsing;
    In Proceedings of IEEE sensors 2002: first IEEE international conference on sensors. Vol. II,
    IEEE, pp. 1256-1259, 2002.

  133. Fast exploration of (delta epsilon)ADC design space
    O. Bajdechi; J.H. Huijsing; G. Gielen;
    In ISCAS 2002 Proceedings of the 2002 IEEE international symposium on circuits and systems,
    IEEE, pp. 1-4, 2002. CD-Rom.

  134. An electrical model of the thermal interactions in an integrated wind sensor
    SP. Matova; J.H. Huijsing;
    In s.n. (Ed.), ET 2002 The eleventh international scientific and applied science conference. Book 2,
    Technical University, pp. 22-27, 2002.

  135. Power optimization in (epsilon delta) ADC design
    O. Bajdechi; J.H. Huijsing; G. Gielen;
    In AN Skodras; AG Constantinides (Ed.), DSP2002 14th international conference on digital signal processing proceedings,
    IEEE, pp. 1-6, 2002.

  136. Calibration of Smart Temperature Sensors Using an On-Chip Transistor as Reference Thermometer
    M. A. P. Pertijs; J. H. Huijsing;
    In Annual Workshop on Semiconductor Sensors (SeSens),
    The Netherlands, pp. 657-661, November 2002.

  137. Non-idealities of temperature sensors using substrate PNP transistors
    M. A. P. Pertijs; G. C. M. Meijer; J. H. Huijsing;
    In Proc. IEEE Sensors Conference,
    IEEE, pp. 1018‒1023, June 2002. DOI: 10.1109/ICSENS.2002.1037251
    Abstract: ... This paper describes the nonidealities of temperature sensors based on substrate pnp transistors and shows how their influence can be minimized The effects of series resistance, current-gain variation, high-level injection and the Early effect on the accuracy of the PTAT voltage are discussed. The results of measurements made on substrate pnp transistors in a standard 0.5μm CMOS process are presented to show the effects of these nonidealities. It is shown that the modeling of the PTAT voltage can be improved by taking the temperature dependency of the effective emission coefficient into account using the reverse Early effect. With this refinement, the temperature can be extracted from the measurement data with an absolute accuracy of ±0.1°C in the range of -50°C to 130°C.

  138. Transistor temperature measurement for calibration of integrated temperature sensors
    M. A. P. Pertijs; J. H. Huijsing;
    In Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC),
    IEEE, pp. 755‒758, May 2002. DOI: 10.1109/IMTC.2002.1006936
    Abstract: ... A temperature measurement technique is presented for calibrating packaged integrated temperature sensors. An on-chip bipolar transistor is used to accurately determine the sensor's temperature during calibration. The transistor's base-emitter voltage is measured at three collector currents to find the absolute temperature while compensating for series resistances. The technique does not increase the pin count for a typical smart sensor, as the transistor can be accessed via the supply pins and an existing digital input pin. Measurements on substrate pnp's in a standard CMOS process show that the temperature can be determined with an accuracy of ±0.1°C in the range of -50°C to 130°C.

  139. Amplifier with stabilization means
    J.H. Huijsing; K-J. de Langen;
    2002.

  140. Non-linear signal correction
    M. A. P. Pertijs; A. Bakker; J. H. Huijsing;
    Patent, United States 6,456,145, September 2002.

  141. A wind-sensor interface using thermal sigma-delta modulation techniques
    K.A.A. Makinwa; J.H. Huijsing;
    Sensors and Actuators A: Physical: an international journal devoted to research and development of physical and chemical transducers,
    Volume 92, pp. 280-285, 2001.

  142. A CMOS nested-chopper instrumentation amplifier with 100-nV offset
    A. Bakker; K. Thiele; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 35, Issue 12, pp. 1877-1883, 2001.

  143. A quadrature data-dependent DEM algorithm to improve image rejection of a complex sigma delta modulator
    L.J. Breems; EC. Dijkmans; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 36, Issue 12, pp. 1879-1886, 2001.

  144. A 1.8-mW CMOS Sigma-Delta modulator with integrated mixer for A/D conversion of IF siignals
    L.J. Breems; E.J. van der Zwan; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 35, Issue 4, pp. 468-475, 2001.

  145. Continuous-time sigma-delta modulation for A/D conversion in radio receivers
    L.J. Breems; J.H. Huijsing;
    Kluwer Academic Publishers, , 2001.

  146. Operational amplifiers: theory and design
    J.H. Huijsing;
    Kluwer, , 2001.

  147. A smart wind-sensor based on thermal sigma-delta modulation
    K.A.A. Makinwa; J.H. Huijsing;
    In Springer, pp. 1-4, 2001.

  148. Single-chip low voltage analog-to-digital interface for encapsulation with electret microphone
    O. Bajdechi; J.H. Huijsing;
    In Transducers'01: technical papers,
    Springer, pp. 122-125, 2001.

  149. CMOS thermopiles for wafer-thick wind sensor
    SP. Matova; K.A.A. Makinwa; J.H. Huijsing;
    In {et al.}; DR Ivanov (Ed.), The tenth international scientific and applied science conference electronics ET'2001; proceedings of the conference book 1,
    Technical University Sofia, pp. 89-94, 2001.

  150. Industrial design of a solid-state wind sensor
    K.A.A. Makinwa; J.H. Huijsing; A. Hagedoorn;
    In SIcon'01: proceedings,
    IEEE, pp. 68-71, 2001.

  151. A single-chip analog-to-digital conversion system for audio codecs
    O. Bajdechi; J.H. Huijsing;
    In SCI 2001: proceedings CD-ROM,
    International Institute of Informatics and Systems, pp. 1-5, 2001.

  152. Three dimensional computer model of a smart wind sensor
    SP. Matova; J.H. Huijsing;
    In SAFE - ProRISC - SeSens 2001: proceedings. Semiconductors Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology,
    STW Technology Foundation, pp. 834-838, 2001.

  153. Optimization of signal-to-noise and signal-to-ofset performance of an integrated thermopile sensor interfaced by a chopper amplifier
    SP. Matova; J.H. Huijsing;
    In SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology,
    STW Technology Foundation, pp. 496-499, 2001.

  154. A wind sensor with an integrated chopper amplifier
    K.A.A. Makinwa; J.H. Huijsing;
    In SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology,
    STW Technology Foundation, pp. 830-833, 2001.

  155. Sigma-delta A/D converter using a high-ripple Chebyshev loop filter
    M.F. Snoeij; O. Bajdechi; J.H. Huijsing;
    In ProRISC 2001: proceedings CD-ROM,
    STW Technology Foundation, pp. 619-622, 2001.

  156. A Quadrature data-dependent DEM alogorithm to improve image rejection of a complex sigma delta Modular
    L.J. Breems; EC. Dijkmans; J.H. Huijsing;
    In Proceedings ISSCC 2001,
    IEEECircuits and Systems Society, pp. 48, 49-en 428, 2001.

  157. Editorship:
    J.H. Huijsing; A.H.M. van Roermund; M. Steyaert;
    In Proceedings AACD 2001,
    s.n., pp. -, 2001.

  158. A 1.8 Sigma-Delta modulator interface for electret microphone with on-chip reference
    O. Bajdechi; J.H. Huijsing;
    In Proceedings,
    IEEE, pp. 31-34, 2001.

  159. Thermopile design for a cmos wind-sensor
    K.A.A. Makinwa; SP. Matova; J.H. Huijsing;
    In {M Elwenspoek} (Ed.), Proceedings,
    Kluwer, pp. 77-82, 2001.

  160. Constant power operation of a two-dimensional flow sensor using thermal sigma-delta modulation techniques
    K.A.A. Makinwa; J.H. Huijsing;
    In IMTC'2001: proceedings,
    IEEE, pp. 1577-1580, 2001.

  161. A wind-sensor with integrated interface electronics
    K.A.A. Makinwa; J.H. Huijsing;
    In ISCAS'2001: CD-ROM,
    IEEE, pp. 356-359, 2001.

  162. A 4th-order switched-capacitor sigma-delta A/D convertor using a high-ripple Chebyshev loop filter
    M.F. Snoeij; O. Bajdechi; J.H. Huijsing;
    In ISCAS 2001: CD-ROM,
    IEEE, pp. 615-618, 2001.

  163. A wind sensor with an integrated low-offset instrumentation amplifier
    K.A.A. Makinwa; J.H. Huijsing;
    In ICECS 2001: proceedings,
    IEEE, pp. 1505-1508, 2001.

  164. A smart wind sensor using time-multiplexed thermal Sigma-Delta modulators
    K.A.A. Makinwa; J.H. Huijsing;
    In ESSCIRC 2001: proceedings,
    Frontier Group, pp. 460-463, 2001.

  165. A batch-calibrated smart temperature sensor with second-order curvature correction
    M. A. P. Pertijs; A. Bakker; J. H. Huijsing;
    In Annual Workshop on Semiconductor Sensors (SeSens),
    The Netherlands, pp. 852‒855, November 2001.

  166. An Accurate CMOS Smart Temperature Sensor with Dynamic Element Matching and Second-Order Curvature Correction
    M. A. P. Pertijs; A. Bakker; J. H. Huijsing;
    In Proc. International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS),
    Springer Berlin Heidelberg, pp. 80‒83, June 2001. DOI: 10.1007/978-3-642-59497-7_18
    Abstract: ... A CMOS temperature sensor with digital bus interface is presented that combines dynamic element matching and second-order curvature correction to improve the accuracy. An error analysis is presented which shows that the remaining inaccuracy is determined by the process spread of substrate bipolar transistors. This spread is significantly less within a batch than between batches. Therefore, all sensors within a batch can be calibrated in the same way, leading to a three-sigma accuracy of ±1.5°C in the range of −50 to 120°C.

  167. A high-accuracy temperature sensor with second-order curvature correction and digital bus interface
    M. A. P. Pertijs; A. Bakker; J. H. Huijsing;
    In Proc. IEEE International Symposium on Circuits and Systems (ISCAS),
    IEEE, pp. 368‒371, May 2001. DOI: 10.1109/ISCAS.2001.921869
    Abstract: ... A high-accuracy CMOS temperature sensor with integrated bus interface is presented. It is shown that when offset cancellation and dynamic element matching techniques are applied, the accuracy of the sensor is mainly limited by process spread between batches on the substrate bipolar transistors. Therefore, the sensors can be calibrated per batch instead of per sensor. In combination with a second-order curvature correction technique, this results in a three-sigma accuracy of ±1.5°C over the full temperature range.

  168. Voltage and/or current reference circuit
    K.J. de Langen; J.H. Huijsing;
    2001.

  169. Circuit comprising means for reducing the dc-offset and the noise produced by an amplifier
    A. Bakker; J.H. Huijsing;
    2001.

  170. Current generator for delivering a reference current of which the value is proportional to the absolute temperature
    A. Bakker; J.H. Huijsing;
    2001.

  171. Non-linear signal correction
    M. A. P. Pertijs; A. Bakker; J. H. Huijsing;
    Patent, WO PCT/EP2001/011,288, September 2001.

  172. A CMOS nested-chopper instrumentation amplifier with 100-nV offset
    A. Bakker; K. Thiele; J.H. Huijsing;
    IEEE Journal of Solid State Circuits,
    Volume 35, Issue 12, pp. 1877-1883, 2000.

  173. Editorship
    J.H. Huijsing;
    {W Sansen}; {R Plassche}, {van de} (Ed.);
    s.n., , 2000.

  174. High-accuracy CMOS smart temperature sensors
    A. Bakker; J.H. Huijsing;
    Kluwer, , 2000.

  175. Development and applications of novel optoelectromechanical system micro-machined in silicon
    G. Vdovin; P.J. French; J.H. Huijsing; M. Loktev;
    s.n., , 2000. 31063.

  176. A wind-sensor interface based on thermal sigma-delta modulation
    K.A.A. Makinwa; J.H. Huijsing;
    In {R Reus}, de; {S Bouwstra} (Ed.), Eurosensors XIV,
    Mikroelektronik Centret, pp. 294-252, 2000.

  177. A CMOS nested chopper instrumentation amplifier with 100 nV offset
    A. Bakker; J.H. Huijsing;
    In 47th Annual ISSCC: digest of technical papers,
    IEEE, pp. 156-157, 2000.

  178. Device with common mode feedback for a differential output (joint research contract, Philips Semiconductors, Sunnyvale, Ca, USA)
    J.H. Huijsing;
    2000.

  179. Device for determining the direction and speed of an air flow (joint research contract, Philips Semiconductors, Sunnyvale, Ca, USA)
    J.H. Huijsing;
    2000.

  180. Rail-to-rail input stages with constant Gm and constant common-mode output currents (joined research contract, Philips Semiconductors Sunnyvale, Ca, USA - TUD)
    J.H. Huijsing;
    2000.

  181. Multi-stage amplifier with frequency compensation (joint research contract, Philips Semiconductors, Sunnyvale, Ca, USA)
    J.H. Huijsing;
    2000.

  182. Combination drive-summing circuit for rail-to-rail differential amplifier (joint research contract, Philips Semiconductors, Sunnyvale, Ca, USA)
    J.H. Huijsing;
    2000.

  183. Low-cost CMOS smart temperature sensor with digital bus interface
    A. Bakker; J.H. Huijsing;
    Journal {"}A{"},
    Volume 40, Issue 1, pp. 31-35, 1999.

  184. Compact low-voltage and high-speed CMOS, BiCMOS and bipolar operational amplifiers
    K.J. de Langen; J.H. Huijsing;
    Kluwer, , 1999.

  185. A low-cost high-accuracy CMOS smart temperature sensor
    A. Bakker; J.H. Huijsing;
    {BJ Hosticka}; {G Zimmer}; {H Grünbacher} (Ed.);
    Editions Frontieres, , pp. 302-305, 1999.

  186. A CMOS spinning-current Hall effect sensor with integrated submicrovolt offset instrumentation amplifier
    A. Bakker; J.H. Huijsing;
    In SAFE99: proceedings. ProRISC99: proceedings [CD-ROM],
    STW Technology Foundation, pp. 17-20, 1999.

  187. A 1.8mW CMOS ED modulator with integrated mixer for A/D conversion of IF signals
    L.J. Breems; W.F. van der Zwan; C. Dijkmans; J.H. Huijsing;
    In ISSCC 1999: digest of technical papers,
    IEEE, pp. 52-53, 1999.

  188. Design for optimum performance-to-power ratio of a continuous-time ED modulator
    L.J. Breems; W.F. van der Zwan; J.H. Huijsing;
    In {BJ Hosticka}; {G Zimmer}; {H Grünbacher} (Ed.), ESSIRC '99: proceedings,
    Editions Frontieres, pp. 318-321, 1999.

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Last updated: 11 Aug 2017