Department of Microelectronics
Faculty of Electrical Engineering, Mathematics, and Computer Science

dr. R. L. Leijsen

PhD student
Terahertz Sensing (THZ), Department of Microelectronics

PhD thesis (Mar 2024): Electrical property mapping using MRI: analytical methods and implementations
Promotor: Andrew Webb, Rob Remis

Expertise: Electrical Properties Tomography using MRI

Biography

Reijer Leijsen was born in Alkmaar at the 6th of April in 1992 and raised in Schoorl, The Netherlands. After graduating at the Murmellius Gymnasium, he studied Electrical Engineering at the Delft University of Technology. In his third year, he followed a minor program in Biomedical Engineering where his interests in the development of imaging and image processing was awakened. As a result, he followed the Biomedical Signal Processing profile of the Electrical Engineering master specialization Signals and Systems, and he completed an internship at the University of Leiden, where he worked on the three-dimensional fast-spin-echo sequence to evaluate this technique for visualization at the inner ear at 7 tesla at the C.J. Gorter Center for High Field MRI under the supervision of dr. ir. Wyger Brink and dr. ir. Rob Remis. For his master thesis he worked on modeling electromagnetic fields and on extending the contrast source inversion method for electrical properties tomography to threedimensional implementations, under supervision of dr. ir. Rob Remis. After receiving his diploma in 2016, he started a PhD program in 2017 at the Leiden University Medical center at the C.J. Gorter Center for High Field MRI group in collaboration with the Delft University of Technology at the Circuits and Systems group under supervision of prof. dr. Andrew Webb and dr. ir. Rob Remis, where he extended the research on electrical properties tomography. Following his PhD, he joined Vitestro in Utrecht in 2021 to contribute to the development of autonomous blood drawing technology.

Publications

  1. Combining deep learning and 3D contrast source inversion in MR‐based electrical properties tomography
    R. Leijsen; C. van den Berg; A. Webb; R. Remis; S. Mandija;
    NMR in Biomedicine,
    Volume 35, Issue 4, 2022. DOI: 10.1002/nbm.4211
    document

  2. Electrical properties tomography: A methodological review
    R. Leijsen; W. Brink; C. van den Berg; A. Webb; R.F. Remis;
    Diagnostics,
    Volume 11, Issue 2, 2021. DOI: 10.3390/diagnostics11020176
    document

  3. Effects of Simulated Error-Sources on Different 3-D CSI-EPT Strategies
    R.L. Leijsen; W.M. Brink; A.G. Webb; R.F. Remis;
    IEEE Transactions on Computational Imaging,
    Volume 7, pp. 713-723, 2021. DOI: 10.1109/TCI.2021.3094742
    document

  4. Transverse-EPT: A local first order electrical properties tomography approach not requiring estimation of the incident fields
    R. Leijsen; W. Brink; Xin An; A. Webb; R.F. Remis;
    Progress In Electromagnetics Research,
    Volume 102, pp. 137-148, 2021. DOI: 10.2528/PIERM21021006
    document

  5. Transverse-EPT: a local first order electrical properties tomography approach free of incident fields
    Reijer Leijsen; Xin An; Wyger Brink; Andrew Webb; Rob Remis;
    In Book of Abstracts ISMRM-Benelux: The 12th Annual Meeting of the ISMRM Benelux Chapter,
    Arnhem (The Netherlands), ISMRM-Benelux, pp. O87, January 2020.

  6. Developments in Electrical Properties Tomography Based on the Contrast-Source Inversion Method
    R. Leijsen; P. Fuchs; W. Brink; A. Webb; Rob Remis;
    Journal of Imaging,
    Volume 5, 2019. DOI: 10.3390/jimaging5020025
    document

  7. Limitations of 2D Field Structure Assumptions in Electrical Properties Tomography and its 3D CSI-EPT Solution
    P. Fuchs; R. Leijsen; R. Remis;
    In IMEP 2019: Second International Workshop on MR-Based Electrical Properties Tomography (proceedings),
    Utrecht (The Netherlands), pp. 48-49, March 2019.
    document

  8. Sensitivity of 3D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation
    R. Leijsen; W. Brink; R. Remis; A. Webb;
    In IMEP 2019: Second International Workshop on MR-Based Electrical Properties Tomography (proceedings),
    Utrecht (The Netherlands), pp. 74-75, March 2019.
    document

  9. Improving Tissue Electrical Properties Reconstructions by Exploiting the Benefits of Combining Deep Learning-EPT and 3D Contrast Source Inversion-EPT
    R. Leijsen; C.A.T. van den Berg; R. Remis; A. Webb; S. Mandija;
    In ISMRM 2019: The 27th Annual Meeting of the ISMRM (book of abstracts),
    Montreal (Canada), pp. 5050, May 2019.
    document

  10. Limitations of 2-D Field Structure Assumptions in Electrical Properties Tomography and its 3-D CSI-EPT Solution
    P. Fuchs; R. Leijsen; R. Remis;
    In ISMRM 2019: The 27th Annual Meeting of the ISMRM (book of abstracts),
    Montreal (Canada), pp. 5054, May 2019.
    document

  11. 3-D Contrast Source Inversion-Electrical Properties Tomography
    R. L. Leijsen; W. M. Brink; C. A. T. van den Berg; A. G. Webb; R. F. Remis;
    IEEE Transactions on Medical Imaging,
    Volume 37, Issue 9, pp. 2080-2089, September 2018. ISSN: 0278-0062. DOI: 10.1109/TMI.2018.2816125
    document

  12. 3D CSI-Electrical Properties Tomography
    R. Leijsen; W. Brink; C. van den Berg; A. Webb; R. Remis;
    In ISMRM18 – International Society for Magnetic Resonance in Medicine 26th Annual Meeting and Exhibition,
    Paris (France), June 2018.
    document

  13. Electrical properties tomography using contrast source inversion techniques
    R. F. Remis; A. W. S. Mandija; R. L. Leijsen; P. S. Fuchs; P. R. S. Stijnman; C. A. T. van den Berg;
    In 2017 International Conference on Electromagnetics in Advanced Applications (ICEAA),
    (Verona, Italy), pp. 1025-1028, September 2017. DOI: 10.1109/ICEAA.2017.8065434
    document

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Last updated: 11 Apr 2024

Reijer Leijsen

Alumnus