Department of Microelectronics
Faculty of Electrical Engineering, Mathematics, and Computer Science

MSc F Mubarak

PhD student
Electronic Circuits and Architectures (ELCA), Department of Microelectronics

Biography

Faisal Ali Mubarak (M’12) was born in Lahore, Pakistan, in 1982. He received the B.Sc. degree in electrical engineering from the Rijswijk Polytechnic Institute of Technology, Rijswijk, The Netherlands, in 2006, and the M.Sc. degree in electrical engineering from the Delft University of Technology, Delft, The Netherlands, in 2009. In 2009, he joined the VSL-Dutch Metrology Institute, Delft, where he is currently a Principal Research Scientist with the Department of Research and Development. His current research interests include RF component measurement techniques up to millimeter-wave frequencies. In 2017, he was one of the co-founders of Vertigo Technologies, Delft, a company developing innovative measurement techniques and instruments. Mr. Mubarak is a member of the International Consultative Committee for Electricity and Magnetism Working Group on Radiofrequency Quantities and the European Association of National Metrology Institutes technical sub-committee on Radiofrequencies and Microwaves (WG-RF). He is also a member of the IEEE MTT-11 Technical Committee. He was a co-recipient of the Outstanding Group Achievement Award of the Delft University of Technology and the Ritsema van Eck Prize for designing and launching the first university satellite of The Netherlands in 2007.

Publications

  1. A Novel Calibration Method for Active Interferometer-Based VNAs
    Mubarak, F. A.; Romano, R.; Rietveld, G.; Spirito, M.;
    IEEE Microwave and Wireless Components Letters,
    Volume 30, Issue 8, pp. 829-832, 2020. DOI: 10.1109/LMWC.2020.3006701

  2. Automated Contacting of On-Wafer Devices for RF Testing
    Mubarak, F.; Martino, C. D.; Toskovic, R.; Rietveld, G.; Spirito, M.;
    In 2020 Conference on Precision Electromagnetic Measurements (CPEM),
    pp. 1-2, 2020. DOI: 10.1109/CPEM49742.2020.9191800

  3. Noise Behavior and Implementation of Interferometer-Based Broadband VNA
    Mubarak, Faisal Ali; Romano, Rafaelle; Galatro, Luca; Mascolo, Vincenzo; Rietveld, Gert; Spirito, Marco;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 67, Issue 1, pp. 249-260, 2019. DOI: 10.1109/TMTT.2018.2874667

  4. The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances
    Romano, Raffaele; Mubarak, Faisal; Spirito, Marco; Galatro, Luca;
    In 2019 93rd ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-6, 2019. DOI: 10.1109/ARFTG.2019.8739232

  5. On the definition of reference planes in probe-level calibrations
    L. Galatro; F. Mubarak; M. Spirito;
    In 2016 87th ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-4, May 2016.

  6. Improved RSOL planar calibration via EM modelling and reduced spread resistive layers
    M. Spirito; L. Galatro; G. Lorito; T. Zoumpoulidis; F. Mubarak;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-5, Dec 2015.

  7. Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements
    F. Mubarak; R. Romano; M. Spirito;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-3, Dec 2015.

  8. A method for de-embedding cable flexure errors in S-parameter measurements
    F. Mubarak; G. Rietveld; M. Spirito;
    In 83rd ARFTG Microwave Measurement Conference,
    pp. 1-5, June 2014.

  9. Characterizing cable flexure effects in S-parameter measurements
    F. Mubarak; G. Rietveld; D. Hoogenboom; M. Spirito;
    In 82nd ARFTG Microwave Measurement Conference,
    pp. 1-7, Nov 2013.

BibTeX support

Last updated: 5 Mar 2021

Faisal Mubarak