Department of Microelectronics
Faculty of Electrical Engineering, Mathematics, and Computer Science

MSc F Mubarak

PhD student
Electronic Circuits and Architectures (ELCA), Department of Microelectronics


Promotor: Marco Spirito, Leo de Vreede

Biography

Faisal Ali Mubarak (M’12) was born in Lahore, Pakistan, in 1982. He received the B.Sc. degree in electrical engineering from the Rijswijk Polytechnic Institute of Technology, Rijswijk, The Netherlands, in 2006, and the M.Sc. degree in electrical engineering from the Delft University of Technology, Delft, The Netherlands, in 2009. In 2009, he joined the VSL-Dutch Metrology Institute, Delft, where he is currently a Principal Research Scientist with the Department of Research and Development. His current research interests include RF component measurement techniques up to millimeter-wave frequencies. In 2017, he was one of the co-founders of Vertigo Technologies, Delft, a company developing innovative measurement techniques and instruments. Mr. Mubarak is a member of the International Consultative Committee for Electricity and Magnetism Working Group on Radiofrequency Quantities and the European Association of National Metrology Institutes technical sub-committee on Radiofrequencies and Microwaves (WG-RF). He is also a member of the IEEE MTT-11 Technical Committee. He was a co-recipient of the Outstanding Group Achievement Award of the Delft University of Technology and the Ritsema van Eck Prize for designing and launching the first university satellite of The Netherlands in 2007.

Publications

  1. A Rigorous Analysis of the Random Noise in Reflection Coefficients Synthesized via Mixed-Signal Active Tuners
    Mubarak, Faisal; Munoz, Fabio; Spirito, Marco;
    In 2023 101st ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-4, 2023. DOI: 10.1109/ARFTG57476.2023.10279048
    Keywords: ... Additive noise;Tuners;Baseband;Uncertainty;Impedance measurement;Transfer functions;Reflection coefficient;S-parameter noise;frequency domain noise;residual-error;noise analysis;uncertainty analysis;vector network analyzer (VNA).

  2. Impedance Standard Substrate Characterization and EM model definition for Cryogenic and Quantum-Computing Applications
    Shokrolahzade, Ehsan; Sebastiano, Fabio; Mubarak, Faisal; Babaie, Masoud; Spirito, Marco;
    In 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
    pp. 557-560, 2023. DOI: 10.1109/IMS37964.2023.10188097
    Keywords: ... Temperature measurement;Kelvin;Cryogenics;Microwave devices;Transformers;Load management;Calibration.

  3. A Novel Calibration Method for Active Interferometer-Based VNAs
    Mubarak, F. A.; Romano, R.; Rietveld, G.; Spirito, M.;
    IEEE Microwave and Wireless Components Letters,
    Volume 30, Issue 8, pp. 829-832, 2020. DOI: 10.1109/LMWC.2020.3006701
    Keywords: ... Calibration;Interferometers;Measurement uncertainty;Impedance measurement;Impedance;Q measurement;Radio frequency;Calibration;extreme impedance measurement;impedance mismatch;measurement;microwave interferometry;nanoelectronics;nanostructures;noise;traceability;vector network analyzer (VNA).

  4. Automated Contacting of On-Wafer Devices for RF Testing
    Mubarak, F.; Martino, C. D.; Toskovic, R.; Rietveld, G.; Spirito, M.;
    In 2020 Conference on Precision Electromagnetic Measurements (CPEM),
    pp. 1-2, 2020. DOI: 10.1109/CPEM49742.2020.9191800
    Keywords: ... Probes;Frequency measurement;Substrates;Measurement uncertainty;Coplanar waveguides;Correlation;Software measurement;On-wafer probing;on-wafer contacting;microwave measurements;measurement techniques;measurement uncertainty;precision measurements;uncertainty.

  5. Noise Behavior and Implementation of Interferometer-Based Broadband VNA
    Mubarak, Faisal Ali; Romano, Rafaelle; Galatro, Luca; Mascolo, Vincenzo; Rietveld, Gert; Spirito, Marco;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 67, Issue 1, pp. 249-260, 2019. DOI: 10.1109/TMTT.2018.2874667
    Keywords: ... Noise measurement;Impedance measurement;Frequency measurement;Impedance;Broadband communication;Radio frequency;Sensitivity;Extreme impedance measurement;impedance mismatch;microwave interferometry;nanoelectronics;nanostructures;noise;vector network analyzer (VNA).

  6. The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances
    Romano, Raffaele; Mubarak, Faisal; Spirito, Marco; Galatro, Luca;
    In 2019 93rd ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-6, 2019. DOI: 10.1109/ARFTG.2019.8739232
    Keywords: ... Calibration;Impedance;Impedance measurement;Sensitivity;Reflection coefficient;Standards;Mixers;vector network analyzer;extreme impedance;interferometer;IQ mixer;high gamma.

  7. Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
    Mubarak, F.; Mascolo, V.; Rietveld, G.; Spirito, M.; Daffe, K.; Haddadi, K.;
    In 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018),
    pp. 1-2, 2018. DOI: 10.1109/CPEM.2018.8500810
    Keywords: ... Uncertainty;Calibration;Coplanar waveguides;Standards;Frequency measurement;Measurement uncertainty;Probes;nanostructures;co-planar waveguide;on-wafer calibration;EM simulation;VNA;measurement uncertainty;precision measurements;traceability.

  8. On the definition of reference planes in probe-level calibrations
    Galatro, Luca; Mubarak, Faisal; Spirito, Marco;
    In 2016 87th ARFTG Microwave Measurement Conference (ARFTG),
    pp. 1-4, 2016. DOI: 10.1109/ARFTG.2016.7501968
    Keywords: ... Calibration;Probes;Standards;Data models;Substrates;Solid modeling;Measurement uncertainty;VNA;calibration;on-wafer;EM simulation;wafer probes;RSOL.

  9. Improved RSOL planar calibration via EM modelling and reduced spread resistive layers
    Spirito, M.; Galatro, L.; Lorito, G.; Zoumpoulidis, T.; Mubarak, F.;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-5, 2015. DOI: 10.1109/ARFTG.2015.7381473
    Keywords: ... Standards;Calibration;Load modeling;Computational modeling;Integrated circuit modeling;Data models;Probes;VNA;calibration;on-wafer;EM simulation;fused silica.

  10. Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements
    Mubarak, Faisal; Romano, Raffaele; Spirito, Marco;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-3, 2015. DOI: 10.1109/ARFTG.2015.7381475
    Keywords: ... Impedance measurement;Impedance;Calibration;Electrical resistance measurement;Instruments;Couplers;Reflection;Extreme impedance;S-parameter;VNA;interferometric principle;active compensation;SMM.

  11. A method for de-embedding cable flexure errors in S-parameter measurements
    Mubarak, Faisal; Rietveld, Gert; Spirito, Marco;
    In 83rd ARFTG Microwave Measurement Conference,
    pp. 1-5, 2014. DOI: 10.1109/ARFTG.2014.6899529
    Keywords: ... Calibration;Measurement uncertainty;Standards;Scattering parameters;Impedance;Semiconductor device measurement;Impedance measurement;S-parameters;cable errors;VNA;PNA;cable flexure;impedance;de-embedding;measurement techniques;RF.

  12. Characterizing cable flexure effects in S-parameter measurements
    Mubarak, Faisal; Rietveld, Gert; Hoogenboom, Dennis; Spirito, Marco;
    In 82nd ARFTG Microwave Measurement Conference,
    pp. 1-7, 2013. DOI: 10.1109/ARFTG-2.2013.6737336
    Keywords: ... Coaxial cables;Measurement uncertainty;Noise;Calibration;Vectors;Scattering parameters;Monte Carlo methods;VNA;PNA;S-parameters;cable effects;cable flexure;impedance;de-embedding;measurement;measurement techniques.

BibTeX support

Last updated: 19 Feb 2025

Faisal Mubarak

Alumnus
  • Left in 2025