MSc Xiao Hu

PhD student
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics

Expertise: Multi-scale simulation, interface failure mechanism, machine learning

Themes: XG - Next Generation Sensing and Communication


Xiao Hu received her M.Sc degree in Materials and Photoelectrons and her Bachelor degree in Physics from East China Normal University (China), in 2020 and 2017 respectively.

In Oct. 2020, She joined the Electronic Components, Technology and Materials (ECTM) group as a PhD student and worked with Prof. Kouchi Zhang. Her main research topic is investigating the failure mechanism of backside metal system by multi-scale and multi-physics simulation.

Fundamentals of backside metals system for 5G RF power modules

  1. Hydrolysis Mechanism Analysis of (Ca, Sr)AlSiN₃:Eu²⁺ Red Phosphor Aged Under Pressure Cooker Test and 85°C&85%RH Test: Kinetics Modeling and First-principles Calculation
    Minzhen Wen; Baotong Guo; Shanghuan Chen; Xiao Hu; Xuejun Fan; Guoqi Zhang; Jiajie Fan;
    In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2023. DOI: 10.1109/EuroSimE56861.2023.10100750

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Last updated: 8 Feb 2021