dr. K. Kouwenhoven
Terahertz Sensing (THZ), Department of Microelectronics
PhD thesis (Jan 2025): Visible to Near-Infrared Kinetic Inductance Detectors
Promotor: Jochem Baselmans, Peter de Visser
Publications
B.T. Buijtendorp; A. Endo; W. Jellema; K. Karatsu; K. Kouwenhoven; D. Lamers; A. J. van der Linden; K. Rostem; H. M. Veen; E. J. Wollack; J. J. A. Baselmans; S. Vollebregt;
Physical Review Applied,
Volume 23, pp. 014035, 2025. DOI: 10.1103/PhysRevApplied.23.014035
K. Kouwenhoven; G.P.J. van Doorn; B.T. Buijtendorp; S.A.H. de Rooij; D. Lamers; D.J. Thoen; V. Murugesan; J.J.A. Baselmans; P.J. de Visser;
Physical Review Applied,
Volume 21, Issue 044036, pp. 1-13, Apr. 2024. DOI: 10.1103/PhysRevApplied.21.044036
Steven de Rooij; Thomas Rugers; Kevin Kouwenhoven; Yannic Alkemade; Tonny Coppens; Jochem Baselmans; Pieter de Visser;
In Proc. SPIE PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI,
Yokohama, Japan, pp. PC1310304, Aug. 2024. DOI: 10.1117/12.3017931
Wilbert G. Ras; Kevin Kouwenhoven; David J. Thoen; Vignesh Murugesan; Jochem J. A. Baselmans; Pieter J. De Visser;
In Proc. SPIE PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI,
Yokohama, Japan, pp. PC1310305, Aug. 2024. DOI: 10.1117/12.3018412
Kevin Kouwenhoven; Daniel Fan; Enrico Biancalani; Steven A.H. de Rooij; Tawab Karim; Carlas S. Smith; Vignesh Murugesan; David J. Thoen; Jochem J.A. Baselmans; Pieter J. de Visser;
Physical Review Applied,
Volume 19, Issue 3, Mar. 2023. DOI: 10.1103/PhysRevApplied.19.034007
B. T. Buijtendorp; S. Vollebregt; K. Karatsu; D. J. Thoen; V. Murugesan; K. Kouwenhoven; S. Hähnle; J. J. A. Baselmans; A. Endo;
Physical Review Applied,
Volume 18, pp. 064003, 2022. DOI: 10.1103/PhysRevApplied.18.064003
Buijtendorp, B. T.; Vollebregt, S. ; Karatsu, K.; Thoen, D. J.; Murugesan, V.; Kouwenhoven, K.; Hähnle, S.; Baselmans, J. J. A.; Endo, A.;
Physical Review Applied,
Volume 18, Issue 6, pp. 064003, 2022. DOI: 10.1103/PhysRevApplied.18.064003
Kouwenhoven, K.; Elwakil, I.; Wingerden; J. van, Murugesan; V., Thoen, D. J.; Baselmans, J. J. A.; Visser, P. J. d.;
Journal of Low Temperature Physics,
pp. 0123456789, 2022. DOI: https://doi.org/10.1007/s10909-022-02774-0
Bruno T. Buijtendorp; Akira Endo; Kenichi Karatsu; David Thoen; Vignesh Murugesan; Kevin Kouwenhoven; Sebastian Hähnle; Jochem J. A. Baselmans; Sten Vollebregt;
In Proc. SPIE PC12190, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XI,
pp. PC121900W, 2022. DOI: 10.1117/12.2630107
Kevin Kouwenhoven; Steven A. de Rooij; Enrico Biancalani; Daniel Fan; Carlas Smith; Vignesh Murugesan; David Thoen; Jochem J. Baselmans; Pieter de Visser;
In Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X,
Montréal, Québec, Canada, SPIE, pp. 1219107, Aug. 2022. DOI: doi.org/10.1117/12.2629220
Steven de Rooij; Kevin Kouwenhoven; Vignesh Murugesan; David J. Thoen; Jochem J. A. Baselmans; Pieter J. de Visser;
In Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X,
Montreal, QC, Canada, SPIE Astronomical Telescopes + Instrumentation, pp. 1219111, Aug. 2022. DOI: doi.org/10.1117/12.2629326
Bruno T. Buijtendorp; Akira Endo; Kenichi Karatsu; David Thoen; Vignesh Murugesan; Kevin Kouwenhoven; Sebastian Hähnle; Jochem J. A. Baselmans; Sten Vollebregt;
In Proc. SPIE PC12190, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XI,
Montreal, QC, Canada, SPIE Astronomical Telescopes + Instrumentation, Aug. 2022. DOI: 10.1117/12.2630107
Hähnle, S.; Kouwenhoven, K.; Buijtendorp, B.; Endo, A.; Karatsu, K.; Thoen, D.J.; Murugesan, V.; Baselmans, J.J.A.;
Physical Review Applied,
Volume 16, Issue 1, pp. 014019, Jul. 2021. DOI: 10.1103/PhysRevApplied.16.014019
B. T. Buijtendorp; S. Vollebregt; K. Karatsu; D. J. Thoen; V. Murugesan; K. Kouwenhoven; S. Hähnle; J. J. A. Baselmans, A. Endo;
arXiv,
2021.
document
M.H.L. Kouwenhoven; A. van Staveren; W.A. Serdijn; C.J.M. Verhoeven;
In Trade-Offs in Analog Circuit Design,
Kluwer Academic Publishers, Nov. 2002.
A. van Staveren; M.H.L. Kouwenhoven; W.A. Serdijn; C.J.M. Verhoeven;
In Trade-Offs in Analog Circuit Design,
Kluwer Academic Publishers, Nov. 2002.
A. van Staveren; M.H.L. Kouwenhoven; W.A. Serdijn; C.J.M. Verhoeven;
In Trade-Offs in Analog Circuit Design,
Kluwer Academic Publishers, Nov. 2002.
C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn;
IEEE Transactions on Communications,
Volume 49, Issue 9, pp. 1510-1514, Sept. 2001.
document
R. van Leuken; R. Nouta; A. de Graaf; M. Kouwenhoven; C. Verhoeven;
In Design, Automation and Test in Europe Conference 2000--user forum,
Paris (F), March 2000.
C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn;
In Proc. International Conference on Communications,
New Orleans, LA, USA, IEEE, pp. 1125-1129, June 18-22 2000. ISBN: 0-7803-6283-7.
document
C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn: Effect of smooth non-linear distortion on OFDM BER;
In Proc. International Symposium on Circuits and Systems (ISCAS),
Geneva, Switzerland, IEEE, pp. 469-472, May 28-31 2000. ISBN: 0-7803-6286-1.
Hartingsveldt K. van; M.H.L. Kouwenhoven; C.J.M. Verhoeven; N.J. Burghartz;
In Proc. SAFE-ProRISC-SeSens,
pp. 285-292, 2000. ISBN 90-73461-24-3.
W.A. Serdijn; J. Mulder; P.J. Poort; M.H.L. Kouwenhoven; A. van Staveren; A.H.M. van Roermund;
In Analog Circuit Design,
Kluwer Academic Publishers, 1999. ISBN: 0-7923-8400-8.
document
C. van den Bos; M.H.L. Kouwenhoven; W.A. Serdijn;
In Proc. ProRISC Workshop on Circuits, Systems and Signal processing,
Mierlo, the Netherlands, Nov. 25-26 1999.
M.H.L. Kouwenhoven; J. Mulder; W.A. Serdijn; A.H.M. van Roermund;
In Proc. International Symposium on Circuits and Systems,
Orlando, FL, USA, IEEE, May 30 - June 2 1999.
document
W.A. Serdijn; J. Mulder; M.H.L. Kouwenhoven; A.H.M. van Roermund;
In Proc. International Symposium on Circuits and Systems,
Orlando, FL, USA, IEEE, May 30 - June 2 1999.
document
M.H.L. Kouwenhoven; J. Mulder; W.A. Serdijn; A.C. van der Woerd; A.H.M. van Roermund;
In Proc. ProRISC Workshop on Circuits, Systems and Signal Processing,
Mierlo, the Netherlands, Nov. 26-27 1998.
W.A. Serdijn; J. Mulder; M.H.L. Kouwenhoven; A.H.M. van Roermund;
In Proc. ProRISC Workshop on Circuits, Systems and Signal Processing,
Mierlo, the Netherlands, Nov. 26-27 1998.
J. Mulder; M.H.L. Kouwenhoven; W.A. Serdijn; A.C. van der Woerd; A.H.M. van Roermund;
In Proc. International Symposium on Circuits and Systems (ISCAS),
Monterey, CA, USA, IEEE, May 31 1998-Jun 1998.
document
BibTeX support
Last updated: 31 Jan 2025

Kevin Kouwenhoven
Alumnus- Left in 2025
- Now: Postdoc at SRON