MSc Hou

1. Contactless Measurement of Absolute Voltage Waveforms by a Passive Electric-Field Probe
   Hou, Rui; Spirito, Marco; Van Rijs, Fred; de Vreede, Leo C. N.;
   IEEE Microwave and Wireless Components Letters,
   Volume 26, Issue 12, pp. 1008-1010, 2016. DOI: 10.1109/LMWC.2016.2623250
   
   Keywords: ...

   Circuit testing;Nonlinear network analysis;Calibration;Capacitance;Voltage measurement;Microstrip;Microwave measurement;Calibration;electric-field probe;microwave circuit testing;nonlinear vector network analyzer (NVNA).

2. Nonintrusive Near-Field Characterization of Spatially Distributed Effects in Large-Periphery High-Power GaN HEMTs
   Hou, Rui; Lorenzini, Martino; Spirito, Marco; Roedle, Thomas; van Rijs, Fred; de Vreede, Leo C. N.;
   IEEE Transactions on Microwave Theory and Techniques,
   Volume 64, Issue 11, pp. 4048-4062, 2016. DOI: 10.1109/TMTT.2016.2613525
   
   Keywords: ...

   Gallium nitride;HEMTs;MODFETs;Load modeling;Power measurement;Logic gates;Device characterization;gallium nitride (GaN);high electron-mobility transistor (HEMT);near-field measurement.

3. Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors
   Hou, Rui; Spirito, Marco; Heeres, Rob; van Rijs, Fred; de Vreede, Leo C.N.;
   In 2015 IEEE MTT-S International Microwave Symposium,
   pp. 1-3, 2015. DOI: 10.1109/MWSYM.2015.7166945
   
   Keywords: ...

   Radio frequency;Indexes;Modems;Performance evaluation;Distributed effects;LDMOS;near-field measurement;power amplifiers.

4. A package-integratable six-port reflectometer for power devices
   Venter, Razvan G.; Rui Hou; Buisman, Koen; Spirito, Marco; Werner, Klaus; de Vreede, Leo C.N.;
   In 2014 IEEE MTT-S International Microwave Symposium (IMS2014),
   pp. 1-4, 2014. DOI: 10.1109/MWSYM.2014.6848549
   
   Keywords: ...

   Pollution measurement;Monitoring;Load modeling;Frequency measurement;Microwave measurement;Abstracts;Layout;Bondwire;directional coupler;package integration;power amplifier;reflection coefficient measurement;six-port reflectometer.

5. Non-intrusive characterization of active device interactions in high-efficiency power amplifiers
   Hou, Rui; Spirito, Marco; Gajadharsing, John; de Vreede, Leo C.N.;
   In 2013 IEEE MTT-S International Microwave Symposium Digest (MTT),
   pp. 1-3, 2013. DOI: 10.1109/MWSYM.2013.6697599
   
   Keywords: ...

   Current measurement;Probes;Ports (Computers);Power amplifiers;Semiconductor device measurement;Power generation;Voltage measurement;Active load modulation;near-field measurement;RF power amplifiers.

6. Contactless measurement of in-circuit reflection coefficients
   Rui Hou; Spirito, Marco; Kooij, Bert-Jan; van Rijs, Fred; de Vreede, Leo C.N.;
   In 2012 IEEE/MTT-S International Microwave Symposium Digest,
   pp. 1-3, 2012. DOI: 10.1109/MWSYM.2012.6259588

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