dr.ir. E. Schrik

1. A combined BEM/FEM method for IC substrate modeling
   E. Schrik;
   PhD thesis, TU Delft, Dept. EEMCS, September 2006.
   document

2. Substrate resistance modeling by combination of BEM and FEM methodologies
   E. Schrik; N.P. van der Meijs;
   In Scientific computing in electrical engineering,
   Heidelberg, Springer, 2004.

3. Combined BEM/FEM vs. 3D FEM substrate resistance modeling
   E. Schrik; N.P. van der Meijs;
   In Prorisc'04,
   Veldhoven, November 2004.

4. Comparing Two Y$\Delta$ Based Methodologies for Realizable Model Reduction
   E. Schrik; N. P. van der Meijs;
   In ProRISC IEEE 14th Annual Workshop on Circuits, Systems and Signal Processing,
   November 2003.
   document

5. Coherent Interconnect/Substrate Modeling Using SPACE - An Experimental Study
   E. Schrik; A.J. van Genderen; N.P. van der Meijs;
   In Proc. of the 33rd European Solid-State Device Research Conf.,
   Estoril, Portugal, pp. 585 -- 588, September 2003.
   document

6. Combined BEM/FEM Substrate Resistance Modeling
   E. Schrik; N.P. van der Meijs;
   In Proc. 39th Design Automation Conference,
   New Orleans, LA, pp. 771-776, June 2002.
   document

7. Substrate Resistance Modeling by Combination of BEM and FEM Methodologies
   E. Schrik; N.P. van der Meijs;
   In W.H.A. Schilders; S.H.M.J. Houben; E.J.W. ter Maten (Ed.), Scientific Computation in Electrical Engineering 2002,
   Eindhoven, NL, pp. 171-172, June 2002. ISBN 90-9015894-4.
   document
   poster http://cas.et.tudelft.nl/space/publications/2002/sceeposter_final.pdf

8. Theoretical and Practical Validation of Combined BEM/FEM Substrate Resistance Modeling
   E. Schrik; P.M. Dewilde; N.P. van der Meijs;
   In Proc. Int. Conf. on Computer-Aided Design,
   San Jose, CA, pp. 10--15, November 2002.
   document

9. Modeling Capactive Effects via the Substrate
   A. J. van Genderen; N. P. van der Meijs; E. Schrik;
   In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
   pp. 366--370, November 2001.
   document

10. Combined BEM/FEM Resistance Modeling of Stratified Substrates with Layout-Dependent Doping Patterns in the Top Layer
    E. Schrik; A. J. van Genderen; N. P. van der Meijs;
    In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
    pp. 598--604, November 2001.
    document

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