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Department of Microelectronics
Faculty of Electrical Engineering, Mathematics, and Computer Science
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Yuelu Li

Electromigration study in cobalt interconnects


Advisor(s): Yaqian Zhang, Sten Vollebregt, GuoQi Zhang

Program: MSc Microelectronics

Yuelu Li

Department of Microelectronics

TU Delft
Fac. EEMCS
Mekelweg 4
2628 CD Delft

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