Reijer Leijsen

Publications

  1. Developments in Electrical Properties Tomography Based on the Contrast-Source Inversion Method
    R. Leijsen; P. Fuchs; W. Brink; A. Webb; Rob Remis;
    Journal of Imaging,
    Volume 5, 2019. DOI: 10.3390/jimaging5020025
    document

  2. Limitations of 2D Field Structure Assumptions in Electrical Properties Tomography and its 3D CSI-EPT Solution
    P. Fuchs; R. Leijsen; R. Remis;
    In IMEP 2019: Second International Workshop on MR-Based Electrical Properties Tomography (proceedings),
    Utrecht (The Netherlands), pp. 48-49, March 2019.
    document

  3. Sensitivity of 3D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation
    R. Leijsen; W. Brink; R. Remis; A. Webb;
    In IMEP 2019: Second International Workshop on MR-Based Electrical Properties Tomography (proceedings),
    Utrecht (The Netherlands), pp. 74-75, March 2019.
    document

  4. Improving Tissue Electrical Properties Reconstructions by Exploiting the Benefits of Combining Deep Learning-EPT and 3D Contrast Source Inversion-EPT
    R. Leijsen; C.A.T. van den Berg; R. Remis; A. Webb; S. Mandija;
    In ISMRM 2019: The 27th Annual Meeting of the ISMRM (book of abstracts),
    Montreal (Canada), pp. 5050, May 2019.
    document

  5. Limitations of 2-D Field Structure Assumptions in Electrical Properties Tomography and its 3-D CSI-EPT Solution
    P. Fuchs; R. Leijsen; R. Remis;
    In ISMRM 2019: The 27th Annual Meeting of the ISMRM (book of abstracts),
    Montreal (Canada), pp. 5054, May 2019.
    document

  6. 3-D Contrast Source Inversion-Electrical Properties Tomography
    R. L. Leijsen; W. M. Brink; C. A. T. van den Berg; A. G. Webb; R. F. Remis;
    IEEE Transactions on Medical Imaging,
    Volume 37, Issue 9, pp. 2080-2089, September 2018. ISSN: 0278-0062. DOI: 10.1109/TMI.2018.2816125
    document

  7. 3D CSI-Electrical Properties Tomography
    R. Leijsen; W. Brink; C. van den Berg; A. Webb; R. Remis;
    In ISMRM18 – International Society for Magnetic Resonance in Medicine 26th Annual Meeting and Exhibition,
    Paris (France), June 2018.
    document

  8. Electrical properties tomography using contrast source inversion techniques
    R. F. Remis; A. W. S. Mandija; R. L. Leijsen; P. S. Fuchs; P. R. S. Stijnman; C. A. T. van den Berg;
    In 2017 International Conference on Electromagnetics in Advanced Applications (ICEAA),
    (Verona, Italy), pp. 1025-1028, September 2017. DOI: 10.1109/ICEAA.2017.8065434
    document

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