Nick van der Meijs

1. Considering Crosstalk Effects in Statistical Timing Analysis
   Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
   IEEE Tr. Computer-Aided Design of Integrated Circuits and Systems,
   Volume 33, Issue 2, pp. 318-322, February 2014. DOI: 10.1109/TCAD.2013.2279515
   document

2. Statistical Transistor-Level Timing Analysis Using a Direct Random Differential Equation Solver
   Qin Tang; J. Rodriguez; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
   IEEE Tr. Computer-Aided Design of Integrated Circuits and Systems,
   Volume 33, Issue 2, pp. 210-223, February 2014. DOI: 10.1109/TCAD.2013.2287179
   document

3. Dynamic Thermal Estimation Methodology for High Performance 3D MPSoC
   A. Zjajo; N.P. van der Meijs; R. van Leuken;
   IEEE Tr. Very Large Scale Integration (VLSI) Systems,
   Volume 22, pp. 1920-1933, 2014.

4. A 0.1 pJ Freeze Vernier time-to-digital converter in 65nm CMOS
   K. Blutman; J. Angevare; A. Zjajo; N.P. van der Meijs;
   In IEEE Int. Conf. Circuits and Systems (ISCAS),
   Melbourne, Australia, IEEE, pp. 85-88, June 2014. DOI: 10.1109/ISCAS.2014.6865071
   document

5. Statistical power optimization of deep-dubmicron digital CMOS circuits based on structured perceptron
   A. Zjajo; N. van der Meijs; R. van Leuken;
   In IEEE International Symposium on Integrated Circuits,
   Singapore, pp. pp. 1-4, 2014.

6. Statistical Transistor-Level Timing Analysis Using a Direct Random Differential Solver
   Qin Tang; J. Rodriguez; A. Zjajo; M. Berkelaar; N. van der Meijs;
   IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
   2013. in press.

7. Considering Crosstalk Effects in Statistical Timing Analysis
   Qin Tang; A. Zjajo; M. Berkelaar; N. van der Meijs;
   IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
   2013. in press.

8. Adaptive Thermal Monitoring of Deep-Submicron CMOS VLSI Circuits
   A. Zjajo; N.P. van der Meijs; R. van Leuken;
   Journal of Low Power Electronics,
   Volume 9, Issue 4, pp. 403-413, December 2013.
   document

9. Dynamic Thermal Estimation Methodology for High Performance 3D MPSoC
   A. Zjajo; N.P. van der Meijs; R. van Leuken;
   IEEE Transactions on Very Large Scale Integration (VLSI) Systems,
   2013. DOI: 10.1109/TVLSI.2013.2280667
   document

10. A CMOS 0.23pJ Freeze Vernier Time-to-Digital Converter
    J. Angevare; K. Blutman; A. Zjajo; N.P. van der Meijs;
    In IEEE Nordic Microelectronics Conference,
    Vilnius, Lithuania, 2013. 4 pages.
    document

11. Balanced Stochastic Truncation of Coupled 3D Interconnect
    A. Zjajo; N. van der Meijs; R. van Leuken;
    In IEEE International Conference on IC Design and Technology,
    Pavia, Italy, pp. 13-16, 2013.
    document

12. An inspiring BSc-EE curriculum for science and engineering
    N.P. van der Meijs; M. Bartek; P. Bauer; A.J. van Genderen; G.J.M. Janssen;
    In Proc. 42-th International European Microwave Conference (EuMC-2012),
    Amsterdam, pp. 494-497, October 2012.
    document

13. Direct Statistical Simulation of Timing Properties in Sequential Circuits
    J. Rodriguez; Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In Proceedings of PATMOS 2012,
    Newcastle upon Tyne, UK, September 2012.
    document

14. Towards An Intrinsically Statistical SPICE-Level Simulator
    M. Berkelaar; Qin Tang; A. Zjajo; J. Rodriguez; N.P. van der Meijs;
    In Proceedings of VARI 2012,
    Sophia Antipolis, France, June 2012.
    document

15. Crosstalk-Aware Statistical Interconnect Delay Calculation
    Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In Proceedings of ASPDAC 2012,
    Sydney, Australia, January 2012.
    document

16. A 11 uW 0C-160C Temperature Sensor in 90 nm CMOS for Adaptive Thermal Monitoring of VLSI Circuits
    A. Zjajo; N.P. van der Meijs; T.G.R.M. van Leuken;
    In Proceedings of ISCAS 2012,
    Seoul, Korea, May 2012.
    document

17. Thermal Analysis of 3D Integrated Circuits Based on Discontinous Galerkin Finite Element Method
    A. Zjajo; N.P. van der Meijs; T.G.R.M. van Leuken;
    In Proceedings of ISQED 2012,
    Santa Clara, CA, USA, March 2012.
    document

18. An Inspiring BSc-EE Curriculum for Science and Engineering
    N.P. van der Meijs; M. Bartek; P. Bauer; A.J. van Genderen; G.J.M. Janssen;
    In Proc. 42th International European Microwave Conference (EuMC-2012),
    Amsterdam, pp. 494-497, Oct. 2012. ISBN 978-2-87487-027-9.

19. A 26 uW 8 bit 10 MS/s Asynchronous SAR ADC for Low Energy Radios
    P.J.A. Harpe; C. Zhou; Yu Bi; N.P. van der Meijs; X. Wang; K. Philips; G. Dolmans; H. de Groot;
    IEEE J. Solid State Circuits,
    Volume 46, Issue 7, pp. 1585-1595, July 2011. 10.1109/JSSC.2011.2143870.
    document

20. Stochastic Analysis of Deep-Submicron CMOS Process for Reliable Circuits Designs
    A. Zjajo; Qin Tang; J. Pineda de Gyvez; M. Berkelaar; A. Di Bucchianico; N.P. van der Meijs;
    IEEE Transactions on Circuits and Systems-I: Regular Papers,
    Volume 58, Issue 1, pp. 164-175, January 2011.
    document

21. Pseudo Circuit Model for Representing Uncertainty in Waveforms
    A. Nigam; Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In Design, Automation and Test in Europe (DATE),
    Grenoble, France, March 2011.
    document

22. Efficient Sensitivity-Based Capacitance Modeling for Systematic and Random Geometric Variations
    Yu Bi; P. Harpe; N.P. van der Meijs;
    In IEEE Asia and South Pacific Design Automation Conference, (ASP-DAC 2011),
    Yokohama, Japan, pp. 61-66, January 2011. ISBN: 978-1-4244-7516-2.
    document

23. Fast Statistical Analysis of RC Nets Subject to Manufacturing Variabilities
    Yu Bi; K.J. van der Kolk; J.F. Villena; L.M. Silveira; N.P. van der Meijs;
    In IEEE Design, Automation and Test in Europe (DATE 2011),
    Grenoble, France, March 2011. Print ISBN: 978-1-61284-208-0, ISSN: 1530-1591.
    document

24. Enhanced Sensitivity Computation for BEM Based Capacitance Extraction Using the Schur Complement Technique
    Yu Bi; S. de Graaf; N.P. van der Meijs;
    In IEEE Custom Integrated Circuits Conference (CICC),
    San Jose (CA), IEEE, September 2011.
    document

25. Accuracy Consideration of a Non-Gaussian Interconnect Delay Model for Submicron CMOS Statistical Static Timing Analysis
    A. Zjajo; Qin Tang; M. Berkelaar; N.P. van der Meijs;
    In IEEE International NanoElectronics Conference (INEC),
    Chang Gung University, Tao-Yuan, Taiwan, June 2011.
    document

26. Balanced Truncation of a Stable Non-Minimal Deep-Submicron CMOS Interconnect
    A. Zjajo; Qin Tang; M. Berkelaar; N.P. van der Meijs;
    In International Conference on IC Design and Technology (ICICDT),
    Kaohsiung, Taiwan, May 2011.
    document

27. Statistical Delay Calculation with Multiple Input Simultaneous Switching
    Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In International Conference on IC Design and Technology (ICICDT),
    Kaohsiung, Taiwan, May 2011.
    document

28. Adaptive Numerical Integration Methods for Deterministic Analysis of Non-Stationary Noise in Dynamic Integrated Circuits
    A. Zjajo; Qin Tang; M. Berkelaar; N.P. van der Meijs;
    In Design and Technology of Integrated Systems (DTIS),
    Athens, Greece, April 2011.
    document

29. Statistical Moment Estimation of Delay and Power in Circuit Simulation
    A. Nigam; Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    Journal of Low Power Electronics,
    Volume 6, Issue 4, December 2010. Invited Paper.
    document

30. Stochastic Analysis of Deep-Submicron CMOS Process for Reliable Circuits Designs
    A. Zjajo; Qin Tang; J. Pineda de Gyvez; M. Berkelaar; A. Di Bucchianico; N.P. van der Meijs;
    IEEE Transactions on Circuits and Systems-I: Regular Papers,
    2010. DOI: 10.1109/TCSI.2010.2055291
    document

31. Transistor Level Waveform Evaluation for Timing Analysis
    Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In European Workshop on CMOS Variability (VARI),
    Montpellier, France, May 2010. 6 pages.
    document

32. RDE-Based Transistor-Level Gate Simulation for Statistical Static Timing Analysis
    Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In IEEE Design Automation Conference (DAC),
    Anaheim, California, pp. 787-792, June 2010.
    document

33. Transistor-Level Gate Modeling for Nano CMOS Circuit Verification Considering Statistical Process Variations
    Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS),
    Grenoble, France, September 2010.
    document

34. Statistical Moment Estimation in Circuit Simulation
    A. Nigam; Qin Tang; A. Zjajo; M. Berkelaar; N.P. van der Meijs;
    In European Workshop on CMOS Variability (VARI),
    Montpellier, France, May 2010.
    document

35. Noise Analysis of Non-Linear Dynamic Integrated Circuits
    A. Zjajo; Qin Tang; M. Berkelaar; N.P. van der Meijs;
    In IEEE Custom Integrated Circuits Conference (CICC 2010),
    San Jose, California, September 2010.
    document

36. Discrete Recursive Algorithm for Estimation of Non-Stationary Noise in Deep-Submicron Integrated Circuits
    A. Zjajo; Qin Tang; M. Berkelaar; N.P. van der Meijs;
    In IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2010),
    Shanghai, China, November 2010.
    document

37. Digital Cartesian Feedback Linearization of Switched Mode Power Amplifiers
    A. Viteri; A. Zjajo; T. Hamoen; N.P. van der Meijs;
    In 17th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2010),
    Athens, Greece, December 2010.
    document

38. Sensitivity Computation Using Domain-Decomposition for Boundary Element Method Based Capacitance Extractors
    Yu Bi; K.J. van der Kolk; N.P. van der Meijs;
    In Proc. IEEE Custom Integrated Circuits Conference (CICC),
    San Jose (CA), IEEE, September 2009.
    document

39. A Simplified Transistor Model for CMOS Timing Analysis
    Qin Tang; A. Zjajo; M. Berkelaar; N. van der Meijs;
    In 20th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, November 2009. ISBN 978-90-73461-62-8.
    document

40. Parameterized RC extraction using SPACE
    Y. Bi; N.P. van der Meijs;
    In 20th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, pp. 202-207, November 2009. ISBN 978-90-73461-62-8.
    document

41. 3D Capacitance extraction based on multi-level hierarchical Schur algorithm
    Zhifeng Sheng; P. Dewilde; N. van der Meijs;
    In 20th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, pp. 551-555, November 2009. ISBN 978-90-73461-62-8.
    document

42. A Radix $2^2$ Based Parallel Pipeline FFT Processor for MB-OFDM UWB system
    Nuo Li; N.P. van der Meijs;
    In 22nd IEEE Int. SOC Conference (SOCC),
    Belfast (UK), IEEE, September 2009.

43. Improved parallel pipeline FFT processor for MB-OFDM UWB system
    Nuo Li; N.P. van der Meijs;
    In 20th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, pp. 475-479, November 2009. ISBN 978-90-73461-62-8.
    document

44. Model order reduction of large RC circuits
    N.P. van der Meijs;
    In Model order reduction: theory, research aspects and applications,
    Berlin, Springer Verlag, 2008. ISBN 978-3-540-78840-9.
    document

45. Capacitance Sensitivity Calculation for Interconnects by Adjoint Field Technique
    Y. Bi; N.P. van der Meijs; D. Ioan;
    In 12th IEEE Workshop on Signal Propagation on Interconnects,
    Avignon, France, May 2008.
    document

46. Sensitivity Computation of Interconnect Capacitances with respect to Geometric Parameters
    Y. Bi; K. van der Kolk; D. Ioan; N.P. van der Meijs;
    In IEEE International Conference on Electrical Performance of Electronic Packaging,
    San Jose, CA, October 2008.
    document

47. Process variation aware modeling of interconnect capacitance
    Y. Bi; N.P. van der Meijs;
    In 19th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, November 2008.

48. A circuit-formulation for the non-retarded Maxwell equations
    K.J. van der Kolk; N.P. van der Meijs;
    In 19th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, November 2008.

49. Surface integrated field equations method for computing 3D static and stationary electric and magnetic fields
    Z. Sheng; N.P. van der Meijs;
    In 19th annual workshop on circuits, systems and signal processing--ProRISC,
    Veldhoven, STW, November 2008.

50. Effects of manufacturing variability on integrated passive components
    Y. Bi; N.P. van der Meijs; W.H.A. Schilders;
    In IEEE/ProRISC workshop on Circuits, Systems and Signal Processing,
    Veldhoven (NL), IEEE, November 2007. ISBN 978-90-73461-49-9.

51. Maxwell equations on unstructured grids using finite integration methods
    W.J. Schoenmaker; P. Meuris; E. Janssens; K.J. van der Kolk; N.P. van der Meijs; W.H.A. Schilders;
    In IEEE Proc. 12th Int. Conf. on Simulation of Semiconductor Processes and Devices (SISPAD 2007),
    Vienna (Austria), IEEE, pp. 333-336, 2007.

52. Models for integrated components coupled with their EM Environment
    D. Ioan; W.H.A. Schilders; G. Ciuprina; N.P. van der Meijs; W.J. Schoenmaker;
    In IEEE Proc. 13th Int. Symp. on Electronmagnetic Fields in Mechatronics, Electrical and Electronic Eng. (ISEF 2007),
    Prague (Czech Rep.), IEEE, pp. 333-336, 2007.

53. A software tool for 3D meshing of VLSI interconnect structures
    K.J. van der Kolk; N.P. van der Meijs;
    In Proc. 17th annual workshop on Circuits, Systems and Signal Processing (ProRISC),
    Veldhoven (NL), pp. 286-292, November 2006.
    document

54. Iterative solution methods based on the hierarchically semi-separable representation
    Z. Sheng; P. Dewilde; N. van der Meijs;
    In Proc. 17th annual workshop on Circuits, Systems and Signal Processing (ProRISC),
    Veldhoven (NL), pp. 343-349, November 2006.
    document

55. On the Implementation of a 3-Dimensional Delaunay-based Mesh Generator
    K.J. van der Kolk; N.P. van der Meijs;
    In G. Ciuprina; D. Ioan (Ed.), SCEE 2006 Book of Abstracts,
    Sinaia, RO, pp. 171-172, 2006. ISBN: 978-973-718-520-4.

56. An Efficient Method for Substrate Impedance Extraction
    Q. Wang; N.P. van der Meijs;
    In Conference on PhD Research In Microelectronics and Electronics (PRIME 2005),
    Lausanne, CH, July 2005.

57. Substrate resistance modeling by combination of BEM and FEM methodologies
    E. Schrik; N.P. van der Meijs;
    In Scientific computing in electrical engineering,
    Heidelberg, Springer, 2004.

58. Statistically aware buffer planning
    G.S. Garcea; N.P. van der Meijs; K.J. van der Kolk; R.H.M.J. Otten;
    In DATE'04,
    Paris, pp. 1402-1403, February 2004.
    document

59. Throughput driven unidirectional bus design for NoC applications
    G. Garcea; N.P. van der Meijs;
    In Prorisc'04,
    Veldhoven, November 2004.

60. Combined BEM/FEM vs. 3D FEM substrate resistance modeling
    E. Schrik; N.P. van der Meijs;
    In Prorisc'04,
    Veldhoven, November 2004.

61. SPACE for Substrate Resistance Modeling
    N. P. van der Meijs;
    In Kluwer Book on Substrate Coupling,
    Kluwer, 2003.
    document

62. Comparing Two Y$\Delta$ Based Methodologies for Realizable Model Reduction
    E. Schrik; N. P. van der Meijs;
    In ProRISC IEEE 14th Annual Workshop on Circuits, Systems and Signal Processing,
    November 2003.
    document

63. Coherent Interconnect/Substrate Modeling Using SPACE - An Experimental Study
    E. Schrik; A.J. van Genderen; N.P. van der Meijs;
    In Proc. of the 33rd European Solid-State Device Research Conf.,
    Estoril, Portugal, pp. 585 -- 588, September 2003.
    document

64. Partial Inductance Extraction with an Exponentially Damped Potential Compared to Virtual Screening
    A.J. Dammers; N.P. van der Meijs;
    In Proc. 6th IEEE workshop on Signal Propagation on Interconnects,
    Castelvecchio Pascoli - Pisa, Italy, IEEE, pp. 29-32, May 2002.
    document

65. Combined BEM/FEM Substrate Resistance Modeling
    E. Schrik; N.P. van der Meijs;
    In Proc. 39th Design Automation Conference,
    New Orleans, LA, pp. 771-776, June 2002.
    document

66. Substrate Resistance Modeling by Combination of BEM and FEM Methodologies
    E. Schrik; N.P. van der Meijs;
    In W.H.A. Schilders; S.H.M.J. Houben; E.J.W. ter Maten (Ed.), Scientific Computation in Electrical Engineering 2002,
    Eindhoven, NL, pp. 171-172, June 2002. ISBN 90-9015894-4.
    document
    poster http://cas.et.tudelft.nl/space/publications/2002/sceeposter_final.pdf

67. Model Reduction for VLSI Physical Verification
    N.P. van der Meijs;
    In Proc. URSI General Assembly 2002,
    Maastricht, NL, International Union of Radio Science, August 2002.
    document

68. Theoretical and Practical Validation of Combined BEM/FEM Substrate Resistance Modeling
    E. Schrik; P.M. Dewilde; N.P. van der Meijs;
    In Proc. Int. Conf. on Computer-Aided Design,
    San Jose, CA, pp. 10--15, November 2002.
    document

69. Modeling Capactive Effects via the Substrate
    A. J. van Genderen; N. P. van der Meijs; E. Schrik;
    In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
    pp. 366--370, November 2001.
    document

70. Combined BEM/FEM Resistance Modeling of Stratified Substrates with Layout-Dependent Doping Patterns in the Top Layer
    E. Schrik; A. J. van Genderen; N. P. van der Meijs;
    In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
    pp. 598--604, November 2001.
    document

71. Assessment of 3D Interconnect Geometry at the System Level
    G. S. Garcea; N. P. van der Meijs;
    In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
    pp. 361--365, November 2001.
    document

72. Accurate and Efficient Layout Extraction
    N.P. van der Meijs;
    PhD thesis, Delft Univ. Techn., The Netherlands, 1992.
    document

73. A data management interface to facilitate CAD/IC software exchanges
    N. van der Meijs; P. van der Wolf; I. Widya; P. Dewilde;
    In Proc. IEEE ICCD '87,
    pp. 403-406, 1987.

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